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XM33C321ASPZR Datasheet(PDF) 46 Page - Texas Instruments |
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XM33C321ASPZR Datasheet(HTML) 46 Page - Texas Instruments |
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46 / 113 page ![]() over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT CL, eff Integrated effective load capacitance(1) 1 pF tstart, LFXT LFXT start-up time 483 640 ms ILFXT LFXT current consumption XT1DRIVE=TBD, LOWCAP=TBD 200 nA Low frequency digital clock input (LFCLK_IN) fLFIN LFCLK_IN frequency (2) SETUSEEXLF=1 29491 32768 36045 Hz DCLFIN LFCLK_IN duty cycle (2) SETUSEEXLF=1 40 60 % LFCLK Monitor fFAULTLF LFCLK monitor fault frequency (3) MONITOR=1 2800 4200 8400 Hz (1) This includes parasitic bond and package capacitance (≈2pF per pin), calculated as CLFXIN×CLFXOUT/(CLFXIN+CLFXOUT), where CLFXIN and CLFXOUT are the total capacitance at LFXIN and LFXOUT, respectively. (2) The digital clock input (LFCLK_IN) accepts a logic level square wave clock. (3) The LFCLK monitor may be used to monitor the LFXT or LFCLK_IN. It will always fault below the MIN fault frequency, and will never fault above the MAX fault frequency. 7.9 Analog Specifications 7.9.1 ADC Specifications 7.9.1.1 ADC Electrical Characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted), all TYP values are measured at 25 ℃ and all accuracy parameters are measured using 12-bit resolution mode (unless otherwise noted)(1) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Vin(ADC) Analog input voltage range(1) Applies to all ADC analog input pins 0 VDD V VR+ Positive ADC reference voltage VR+ sourced from external reference pin (VREF+) 1.4 VDD V VR+ sourced from internal reference (VREF) VREF V VR- Negative ADC reference voltage 0 V FS ADC sampling frequency 12-bit mode, External Reference, VDD ≥ 2.7V and VR+ ≥ 2.5V 9.4 Msps 12-bit mode, External Reference 7.25 Msps I(ADC) (2) Operating supply current into VDD terminal FS = 9.4 MSPS, Internal reference OFF, VR+ = VDD 2.8 mA FS = 4 MSPS, Internal reference OFF, VR+ = VDD 1.9 mA CS/H ADC sample-and-hold capacitance 3.3 pF Rin ADC input resistance 0.2 kΩ ENOB Effective number of bits External reference, fIN = 100kHz, HW averaging 8x 12.3 bit External reference, fIN = 100kHz 10.8 Internal reference, fIN = 100kHz, VR+ = VREF = 2.5V (3) 10.5 SNR Signal-to-noise ratio External reference, fIN = 100kHz 66.7 dB Internal reference, fIN = 100kHz, VR+ = VREF = 2.5V (3) 65.5 PSRRDC Power supply rejection ratio, DC External reference, VDD = VDD(MIN) to VDD(MAX) 60 dB VDD = VDD(MIN) to VDD(MAX) Internal reference, VR+ = VREF = 2.5V (3) 50 PSRRAC Power supply rejection ratio, AC External reference, ΔVDD = 0.1 V at 1 kHz 57 dB ΔVDD = 0.1 V at 1 kHz Internal reference, VR+ = VREF = 2.5V (3) 47 twakeup ADC Wakeup Time Assumes internal reference is active 10 us VSupplyMon Supply Monitor voltage divider accuracy ADC input channel: Supply Monitor (VDD/3), (VBAT/3) (4) –1.5 1.5 % ISupplyMon Supply Monitor voltage divider current consumption ADC input channel: Supply Monitor 10 uA (1) The analog input voltage range must be within the selected ADC reference voltage range VR+ to VR– for valid conversion results. (2) The internal reference (VREF) supply current is not included in current consumption parameter I(ADC). (3) Minimum values based on characterization data MSPM33C321A, MSPM33C3219 SLASFB6 – DECEMBER 2025 www.ti.com 46 Submit Document Feedback Copyright © 2025 Texas Instruments Incorporated Product Folder Links: MSPM33C321A MSPM33C3219 |
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