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XM33C321ASPZR Datasheet(PDF) 90 Page - Texas Instruments |
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XM33C321ASPZR Datasheet(HTML) 90 Page - Texas Instruments |
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90 / 113 page ![]() 10.4 Documentation Support To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on Notifications to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. The following documents describe the MSPM33 MCUs. Copies of these documents are available on the Internet at www.ti.com. Technical Reference Manual MSPM33C3x 160- MHz Microcontrollers Technical Reference Manual This manual describes the modules and peripherals of the MSPM33C family of devices. Each description presents the module or peripheral in a general sense. Not all features and functions of all modules or peripherals are present on all devices. In addition, modules or peripherals can differ in their exact implementation on different devices. Pin functions, internal signal connections, and operational parameters differ from device to device. See the device-specific data sheet for these details. 10.5 Support Resources TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. 10.6 Trademarks Code Composer Studio™ and TI E2E™ are trademarks of Texas Instruments. Arm®, Cortex®, and TrustZone® are registered trademarks of Arm Limited. All trademarks are the property of their respective owners. 10.7 Electrostatic Discharge Caution This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. 10.8 Glossary TI Glossary This glossary lists and explains terms, acronyms, and definitions. MSPM33C321A, MSPM33C3219 SLASFB6 – DECEMBER 2025 www.ti.com 90 Submit Document Feedback Copyright © 2025 Texas Instruments Incorporated Product Folder Links: MSPM33C321A MSPM33C3219 |
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