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TMP9R01DGS/EM Datasheet(PDF) 34 Page - Texas Instruments |
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TMP9R01DGS/EM Datasheet(HTML) 34 Page - Texas Instruments |
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34 / 45 page ![]() depends on the printed-circuit board (PCB) size that the device is mounted. For this test, the device is soldered to a two-layer PCB that measures 0.5 inches × 0.5 inches. Time (s) -1 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 0 25 50 75 100 125 Local Remote Local: soldered devices on 62mil 2-layer FR4 PCB Remote: characterized with 2N3906 PNP transistor Figure 9-3. Temperature Step Response 9.3 Radiation Environments Careful consideration must be given to environmental conditions when using a product in a radiation environment. Note During the exposure time, all I2C registers can be continuously read. However, resetting the TMP9R01-SEP and TMP9R01-SP devices before every read is recommended. Without resetting the device, there is a chance the device performs not as accurate as expected. 9.3.1 Single Event Latch-Up One-time single event latch-up (SEL) testing is preformed according to EIA/JEDEC Standard, EIA/JEDEC57. The linear energy transfer threshold (LETth) shown in Features is the maximum LET tested. A test report is available in the TMP9R01-SEP Single-Event Effects (SEE) Radiation Test Report and TMP9R01-SP Single- Event Effects (SEE) Radiation Test Report. 9.3.2 Single Event Functional Interrupt To mitigate the effects of single-event upsets and single-event functional interrupts, write the appropriate value to the pointer register each time a read operation is performed. Relying on the last value stored in the pointer register can increase the probability of a failed read due to a single event upset. If other functions are being used, such as the temperature limit register, occasionally rewriting to these registers can be necessary. 9.3.3 Single Event Upset A report on single event upset (SEU) is available in the TMP9R01-SEP Single-Event Effects (SEE) Radiation Test Report. 9.4 Power Supply Recommendations The TMP9R01-SEP and TMP9R01-SP devices operate with a power-supply range of 1.7V to 3.6V. The device is optimized for operation at a 3.3V supply but can measure temperature accurately in the full supply range. TMP9R01-SEP, TMP9R01-SP SNIS238A – JULY 2025 – REVISED JULY 2026 www.ti.com 34 Submit Document Feedback Copyright © 2026 Texas Instruments Incorporated Product Folder Links: TMP9R01-SEP TMP9R01-SP |
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