| Electronic Components Datasheet Search |
|
OR4 Datasheet(PDF) 45 Page - Lattice Semiconductor |
|
|
|||||||||||||||||||||||||||||
OR4 Datasheet(HTML) 45 Page - Lattice Semiconductor |
|
45 / 152 page ![]() Data Sheet May, 2006 Lattice Semiconductor 45 ORCA Series 4 FPGAs Special Function Blocks (continued) The TAPC generates control signals that allow capture, shift, and update operations on the instruction and data registers. In the capture operation, data is loaded into the register. In the shift operation, the captured data is shifted out while new data is shifted in. In the update operation, either the instruction register is loaded for instruc- tion decode, or the boundary-scan register is updated for control of outputs. The test host generates a test by providing input into the ORCA Series TMS input synchronous with TCK. This sequences the TAPC through states in order to perform the desired function on the instruction register or a data register. Figure 28 provides a diagram of the state transitions for the TAPC. The next state is determined by the TMS input value. 5-5370(F) Figure 28. TAP Controller State Transition Diagram SELECT- DR-SCAN CAPTURE-DR SHIFT-DR EXIT1-DR PAUSE-DR EXIT2-DR UPDATE-DR 1 1 0 0 10 RUN-TEST/ IDLE 1 TEST-LOGIC- RESET SELECT- IR-SCAN CAPTURE-IR SHIFT-IR EXIT1-IR PAUSE-IR EXIT2-IR UPDATE-IR 1 1 0 10 00 0 0 1 0 1 1 1 0 1 1 0 0 0 0 1 11 0 Boundary-Scan Cells Figure 29 is a diagram of the boundary-scan cell (BSC) in the ORCA series PIOs. There are four BSCs in each PIC: one for each pad, except as noted above. The BSCs are connected serially to form the BSR. The BSC controls the functionality of the in, out, and 3-state sig- nals for each I/O pad. The BSC allows the I/O to function in either the normal or test mode. Normal mode is defined as when an out- put buffer receives input from the PLC array and pro- vides output at the pad or when an input buffer provides input from the pad to the PLC array. In the test mode, the BSC executes a boundary-scan operation, such as shifting in scan data from an upstream BSC in the BSR, providing test stimuli to the pad, capturing test data at the pad, etc. The primary functions of the BSC are shifting scan data serially in the BSR and observing input (p_in), output (p_out), and 3-state (p_ts) signals at the pads. The BSC consists of three circuits: the bidirectional data cell is used to access the input and output data, the capture cell is used to capture the status of the I/O pad, and the direction control cell is used to access the 3- state value. All three cells consist of a FF used to shift scan data which feeds a FF to control the I/O buffer. The capture cell is connected serially to the bidirec- tional data cell, which is connected serially to the direc- tion control cell to form a boundary-scan shift register. The TAPC signals (capture, update, shiftn, treset, and TCK) and the MODE signal control the operation of the BSC. The bidirectional data cell is also controlled by the high out/low in (HOLI) signal generated by the direction control cell. When HOLI is low, the bidirec- tional data cell receives input buffer data into the BSC. When HOLI is high, the BSC is loaded with functional data from the PLC. |
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |