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SPC56EC64L8 Datasheet(PDF) 54 Page - STMicroelectronics |
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SPC56EC64L8 Datasheet(HTML) 54 Page - STMicroelectronics |
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54 / 118 page ![]() Electrical Characteristics SPC564Bxx - SPC56ECxx 54/118 Doc ID 17478 Rev 4 4.5.2 Power considerations The average chip-junction temperature, TJ, in degrees Celsius, may be calculated using Equation 1: Equation 1 TJ = TA + (PD × RθJA) Where: TA is the ambient temperature in °C. RθJA is the package junction-to-ambient thermal resistance, in °C/W. PD is the sum of PINT and PI/O (PD =PINT + PI/O). PINT is the product of IDD and VDD, expressed in watts. This is the chip internal power. PI/O represents the power dissipation on input and output pins; user determined. Most of the time for the applications, PI/O< PINT and may be neglected. On the other hand, PI/O may be significant, if the device is configured to continuously drive external modules and/or memories. An approximate relationship between PD and TJ (if PI/O is neglected) is given by: Equation 2 PD = K / (TJ + 273 °C) Therefore, solving equations Equation 1 and Equation 2: Equation 3 K = PD × (TA + 273 °C) + RθJA × PD 2 Where: K is a constant for the particular part, which may be determined from Equation 3 by measuring PD (at equilibrium) for a known TA. Using this value of K, the values of PD and TJ may be obtained by solving equations Equation 1 and Equation 2 iteratively for any value of TA. 1. Thermal characteristics are targets based on simulation that are subject to change per device characterization. 2. VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = −40 to 125 °C. 3. All values need to be confirmed during device validation. 4. 1s board as per standard Jedec (JESD51-7) in natural convection 5. 2s2p board as per standard JEDEC (JESD51-7) in natural convection. Table 13. LBGA256 thermal characteristics(1) Symbol C Parameter Conditions Value Unit RθJA CC — Thermal resistance, junction-to-ambient natural convection Single-layer board—1s TBD °C/W Four-layer board—2s2p TBD 1. Thermal characteristics are targets based on simulation that are subject to change per device characterization. |
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