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SPC56EC64L8 Datasheet(PDF) 88 Page - STMicroelectronics

Part # SPC56EC64L8
Description  32-bit MCU family built on the Power Architecture® for automotive body electronics applications
PDF  118 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

SPC56EC64L8 Datasheet(HTML) 88 Page - STMicroelectronics

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Electrical Characteristics
SPC564Bxx - SPC56ECxx
88/118
Doc ID 17478 Rev 4
RSW1
CC
D
Internal resistance of
analog source
——
3
k
Ω
RSW2
CC
D
Internal resistance of
analog source
——
2
k
Ω
RAD
CC
D
Internal resistance of
analog source
——
2
k
Ω
IINJ
SR — Input current Injection
Current
injection on
one ADC_0
input, different
from the
converted one
VDD =
3.3 V ± 10%
−5—
5
mA
VDD =
5.0 V ± 10%
−5—
5
| INL |
CC
T
Absolute value for
integral non-linearity
No overload
0.5
1.5
LSB
| DNL |
CC
T
Absolute differential
non-linearity
No overload
0.5
1.0
LSB
| OFS |
CC
T Absolute offset error
0.5
LSB
| GNE |
CC
T Absolute gain error
0.6
LSB
TUEP
CC
P Total unadjusted
error(7) for precise
channels, input only
pins
Without current injection
−20.6
2
LSB
T
With current injection
−33
TUEX
CC
T Total unadjusted
error(7) for extended
channel
Without current injection
−31
3
LSB
T
With current injection
−44
1.
VDD = 3.3 V ± 10% / 5.0 V ± 10%, TA = −40 to 125 °C, unless otherwise specified.
2.
Analog and digital VSS_HV must be common (to be tied together externally).
3.
VAINx may exceed VSS_ADC0 and VDD_ADC0 limits, remaining on absolute maximum ratings, but the results of the
conversion will be clamped respectively to 0x000 or 0x3FF.
4.
During the sample time the input capacitance CS can be charged/discharged by the external source. The internal
resistance of the analog source must allow the capacitance to reach its final voltage level within tADC0_S. After the end of
the sample time tADC0_S, changes of the analog input voltage have no effect on the conversion result. Values for the
sample clock tADC0_S depend on programming.
5.
Conversion time = Bit evaluation time + Sampling time + 1 Clock cycle delay.
6.
Refer to ADC conversion table for detailed calculations.
7.
Total Unadjusted Error: The maximum error that occurs without adjusting Offset and Gain errors. This error is a
combination of Offset, Gain and Integral Linearity errors.
Table 43.
ADC conversion characteristics (10-bit ADC_0) (continued)
Symbol
C
Parameter
Conditions(1)
Value
Unit
Min
Typ
Max



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