MCP19124 datasheet(67/236 Pages) MICROCHIP

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 2016 Microchip Technology Inc.

DS20005619A-page 67

MCP19124/5

9.11

Calibration Word 11

Calibration word 11 at memory location 208Ah contains

the calibration bits for the 4V LDO (AVDD) trim

AVDDCAL<3:0> and the offset voltage of the analog

test buffer BUFF<7:0>. AVDD supplies the internal

analog circuitry and is the default ADC Reference

voltage. Firmware must read these values and copy

into the AVDDCAL Special Function Register located in

Bank 3 at 19Dh.

Also stored at address 208Ah is the Analog test MUX

buffer offset value. This is an 8 bit, 2’s complement

word that represents the buffer’s offset voltage in units

of mV. This value can be used to correct for buffer offset

of the analog test signal measurements. See

Section 8.0 “System Bench Testing” for test signal

details.

CALWD11: CALIBRATION WORD 11 REGISTER

U-0

R/P-1

—

AVDDCAL3

AVDDCAL2

AVDDCAL1

AVDDCAL0

bit 13

bit 8

R/P-1

BUFF7

BUFF6

BUFF5

BUFF4

BUFF3

BUFF2

BUFF1

BUFF0

bit 7

bit 0

Legend:

R = Readable bit

P = Programmable bit

U = Unimplemented bit, read as ‘0’

-n = Value at POR

‘1’

= Bit is set

‘0’

= Bit is cleared

x = Bit is unknown

bit 13-12

Unimplemented: Read as ‘0’

bit 11-8

AVDDCAL<3:0>: AVDD 4V LDO Trim bits

bit 7-0

BUFF<7:0>: Analog Test Mux Buffer Offset bits

11111111

= Mid scale (-1 mV)

•

10000000

= Largest negative offset (-128 mV)

01111111

= Largest positive offset (+128 mV)

•

00000000

= Mid scale (0 mV)

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