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MSP430F423IPM Datasheet(PDF) 8 Page - Texas Instruments |
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MSP430F423IPM Datasheet(HTML) 8 Page - Texas Instruments |
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8 / 59 page ![]() 8 MSP430F427, MSP430F425, MSP430F423 SLAS421B – APRIL 2004 – REVISED NOVEMBER 2016 www.ti.com Submit Documentation Feedback Product Folder Links: MSP430F427 MSP430F425 MSP430F423 Terminal Configuration and Functions Copyright © 2004–2016, Texas Instruments Incorporated Table 4-1. Terminal Functions (continued) SIGNAL NAME PIN NO. I/O DESCRIPTION (2) The LCD function is selected automatically when the applicable LCD module control bits are set, not with PxSEL bits. R33 43 O Output port of most positive analog LCD level (V1) P2.1/UCLK0/S24 44 I/O General-purpose digital I/O External clock input for USART0 in UART or SPI mode or clock output for USART0 in SPI mode LCD segment output 24(2) P2.0/TA2/S25 45 I/O General-purpose digital I/O Timer_A Capture: CCI2A input, Compare: Out2 output LCD segment output 25(2) P1.7/SOMI0/S26 46 I/O General-purpose digital I/O Slave out/master in for USART0 in SPI mode LCD segment output 26(2) P1.6/SIMO0/S27 47 I/O General-purpose digital I/O Slave in/master out for USART0 in SPI mode LCD segment output 27(2) P1.5/TACLK/ACLK/S28 48 I/O General-purpose digital I/O Timer_A and SD16 clock signal TACLK input ACLK output (divided by 1, 2, 4, or 8) LCD segment output 28(2) P1.4/S29 49 I/O General-purpose digital I/O LCD segment output 29(2) P1.3/SVSOUT/S30 50 I/O General-purpose digital I/O SVS: output of SVS comparator LCD segment output 30(2) P1.2/TA1/S31 51 I/O General-purpose digital I/O Timer_A, Capture: CCI1A, CCI1B input, Compare: Out1 output LCD segment output 31(2) P1.1/TA0/MCLK 52 I/O General-purpose digital I/O Timer_A, Capture: CCI0B input. Note: TA0 is only an input on this pin. MCLK output BSL receive P1.0/TA0 53 I/O General-purpose digital I/O Timer_A, Capture: CCI0A input, Compare: Out0 output BSL transmit TDO/TDI 54 I/O Test data output port, TDO/TDI data output or programming data input terminal TDI/TCLK 55 I Test data input or test clock input. The device protection fuse is connected to TDI. TMS 56 I Test mode select. TMS is used as an input port for device programming and test. TCK 57 I Test clock. TCK is the clock input port for device programming and test. RST/NMI 58 I Reset input Nonmaskable interrupt input port P2.5/URXD0 59 I/O General-purpose digital I/O Receive data in for USART0 in UART mode P2.4/UTXD0 60 I/O General-purpose digital I/O Transmit data out for USART0 in UART mode |
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