| Electronic Components Datasheet Search |
|
HY27SF161G2M-VIP Datasheet(PDF) 20 Page - Hynix Semiconductor |
|
|
|||||||||||||||||||||||||||||
HY27SF161G2M-VIP Datasheet(HTML) 20 Page - Hynix Semiconductor |
|
20 / 48 page ![]() Rev 0.7 / Apr. 2005 20 Preliminary HY27UF(08/16)1G2M Series HY27SF(08/16)1G2M Series 1Gbit (128Mx8bit / 64Mx16bit) NAND Flash Item Symbol Test Condition Min Max Unit Input / Output Capacitance (1) CI/O VIL=0V - 10 pF Input Capacitance(1) CIN VIN=0V - 10 pF Table 11: Pin Capacitance (TA=25C, F=1.0MHz) Note: 1. For the stacked devices version the Input Capacitance is <TBD> and the I/O capacitance is <TBD> Parameter Symbol Min Typ Max Unit Program Time tPROG - 300 700 us Dummy Busy Time for Cache Program tCBSY -3 700 us Number of partial Program Cycles in the same page Main Array NOP - - 4 Cycles Spare Array NOP - - 4 Cycles Block Erase Time tBERS -2 3 ms Table 12: Program / Erase Characteristics |
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |