HY27SF161G2M-VIP datasheet(40/48 Pages) HYNIX

40 / 48 page

Rev 0.7 / Apr. 2005

Preliminary

HY27UF(08/16)1G2M Series

HY27SF(08/16)1G2M Series

1Gbit (128Mx8bit / 64Mx16bit) NAND Flash

Bad Block Management

Devices with Bad Blocks have the same quality level and the same AC and DC characteristics as devices where all the

blocks are valid. A Bad Block does not affect the performance of valid blocks because it is isolated from the bit line and

common source line by a select transistor. The devices are supplied with all the locations inside valid blocks

erased(FFh). The Bad Block Information is written prior to shipping. Any block where the 1st Byte in the spare area of

the 1st or 2nd page(if the 1st page is Bad) does not contain FFh is a Bad Block. The Bad Block Information must be

read before any erase is attempted as the Bad Block Information may be erased. For the system to be able to recog-

nize the Bad Blocks based on the original information it is recommended to create a Bad Block table following the flow-

chart shown in Figure 29. The 1st block, which is placed on 00h block address is guaranteed to be a valid block.

Block Replacement

Over the lifetime of the device additional Bad Blocks may develop. In this case the block has to be replaced by copying

the data to a valid block. These additional Bad Blocks can be identified as attempts to program or erase them will give

errors in the Status Register.

As the failure of a page program operation does not affect the data in other pages in the same block, the block can be

replaced by re-programming the current data and copying the rest of the replaced block to an available valid block.

The Copy Back Program command can be used to copy the data to a valid block.

See the “Copy Back Program” section for more details.

Refer to Table 18 for the recommended procedure to follow if an error occurs during an operation.

Operation

Recommended Procedure

Erase

Block Replacement

Program

Block Replacement or ECC

Read

ECC

Table 18: Block Failure

Figure 30: Bad Block Management Flowchart

HY27SF161G2M-VIP Datasheet(PDF) 40 Page - Hynix Semiconductor