TLE7269G

Application Information

Data Sheet

28

Rev. 1.2, 2007-11-13

7

Application Information

7.1

ESD Robustness according to IEC61000-4-2

Test for ESD robustness according to IEC61000-4-2 “Gun test” (150 pF, 330

Ω) have been performed. The results

and test conditions are available in a separate test report.

7.2

Pin Compatibility to the Single LIN Transceivers

The Twin LIN Transceiver TLE7269G is pin and function compatible to the Single LIN Transceivers like the

TLE7259G, the TLE7259-2GE and its derivative the TLE7259-2GU. The TLE7269G has a pin for the

V

This supply pin is usually connected to the power supply of the external microcontroller. The TLE7259G and the

TLE7259-2GE/U don’t have a

V

2GE/GU, these two LIN transceiver need an external pull-up resistor between the RxD pin and the microcontroller

supply.

Figure 16

Pin configuration TLE7269G and TLE7259G, TLE7259-2GE/GU

Table 8

ESD Robustness according to IEC61000-4-2

Performed Test

Result

Unit

Remarks

Electrostatic discharge voltage at pin

V

and BUS2 versus GND

≥ +9

kV

1) ESD susceptibility “ESD GUN” according LIN EMC 1.3 Test Specification, Section 4.3. (IEC 61000-4-2) -Tested by external

test house (IBEE Zwickau, EMC Testreport Nr. 05-06-06).

Electrostatic discharge voltage at pin

V

and BUS2 versus GND

≤ -9

kV

1)Negative pulse

Electrostatic discharge voltage at pin WK versus

GND

≥ +8

kV

1)Positive pulse

Electrostatic discharge voltage at pin WK versus

GND

≤ -8

kV

1)Negative pulse

RxD1

1

2

3

4

5

6

78

EN

WK

TxD1

INH1

V

S

BUS1

GND

TxD2

V

IO

RxD2

BUS2

W2O

INH2

9

10

11

12

13

14

RxD

1

2

3

45

6

7

8

EN

WK

TxD

INH

V

S

BUS

GND

TLE7259G

TLE7259-2GE

TLE7259-2GU

and other single LIN

transceivers

TLE7269G