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UM1693 Datasheet(PDF) 41 Page - STMicroelectronics

Part # UM1693
Description  M0-7 standard high-side drivers hardware design guide
PDF  196 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

UM1693 Datasheet(HTML) 41 Page - STMicroelectronics

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UM1693
Protection against battery transients
195
Moreover M0-7 Monolithic HSDs pass the load dump clamped pulse test (class C according
to Table 7 criteria) relevant to the standard ISO-7637-2:2004(E) (5b pulse with 40 V
centralized load dump suppressor) as well as the standard ISO 16750-2:2010 (E) (pulse
with 35 V centralized load dump suppressor).
3.6
Component dimensioning for hybrid devices
Differently from monolithic devices, the Hybrids do not need the external reverse battery
protection network since they have an embedded protection formed by an anti-parallel
Zener diode which prevents the signal clamp activation (refer to Figure 5). Moreover the
reverse battery event enables the self turn-on of output channels. For this reason, during the
ISO transients, the parasitic structures of I/O pins are softly triggered with no high current
flowing through them. Nevertheless, as precaution, a serial protection resistance is
suggested between microcontroller and logic pins to limit the current flowing. Hybrid devices
are fully compliant with the tests level specified in the ISO 7637-2: 2004 (see the relevant
table for more details).
Table 7. ISO 7637-2 2004 and 2011 tests and results on monolithic HSDs
ISO
7637-2
TEST PULSE
1
Level III
1
Level IV
2a
Level III
2a
Level IV(1)
3a
Level III
3a
Level IV
3b
Level III
3b
Level IV
2004
Class C
Class C
Class C
Class C
Class B
Class B
Class B
Class B
2011
Class C
Class C
Class C
Class C or E(1)
Class B
Class B
Class B
Class B
Class C: full operational after each pulse
Class B: full operational even during pulses exposure
Class E: One or more functions of the device do not perform as designed after exposure to disturbance
and cannot be returned to proper operation without replacing the device
1.
The results on pulse ISO7637-2 2011 2a level IV depend mainly on load status and condition (open load, nominal load,
shorted load, resistive load, inductive load, capacitive load). Lower ohmic loads with low inductive contribution help to
increase the sustainable peak voltage for the device reaching Class C compliance. Tests performed on VND7020AJ-E, for
example, give as result class C in the condition ON state with a resistive load equivalent to the nominal one on each output
(see Figure 20); instead they give class E with Outputs in open load.



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