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UM1693 Datasheet(PDF) 41 Page - STMicroelectronics |
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UM1693 Datasheet(HTML) 41 Page - STMicroelectronics |
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41 / 196 page ![]() DocID025505 Rev 1 41/196 UM1693 Protection against battery transients 195 Moreover M0-7 Monolithic HSDs pass the load dump clamped pulse test (class C according to Table 7 criteria) relevant to the standard ISO-7637-2:2004(E) (5b pulse with 40 V centralized load dump suppressor) as well as the standard ISO 16750-2:2010 (E) (pulse with 35 V centralized load dump suppressor). 3.6 Component dimensioning for hybrid devices Differently from monolithic devices, the Hybrids do not need the external reverse battery protection network since they have an embedded protection formed by an anti-parallel Zener diode which prevents the signal clamp activation (refer to Figure 5). Moreover the reverse battery event enables the self turn-on of output channels. For this reason, during the ISO transients, the parasitic structures of I/O pins are softly triggered with no high current flowing through them. Nevertheless, as precaution, a serial protection resistance is suggested between microcontroller and logic pins to limit the current flowing. Hybrid devices are fully compliant with the tests level specified in the ISO 7637-2: 2004 (see the relevant table for more details). Table 7. ISO 7637-2 2004 and 2011 tests and results on monolithic HSDs ISO 7637-2 TEST PULSE 1 Level III 1 Level IV 2a Level III 2a Level IV(1) 3a Level III 3a Level IV 3b Level III 3b Level IV 2004 Class C Class C Class C Class C Class B Class B Class B Class B 2011 Class C Class C Class C Class C or E(1) Class B Class B Class B Class B Class C: full operational after each pulse Class B: full operational even during pulses exposure Class E: One or more functions of the device do not perform as designed after exposure to disturbance and cannot be returned to proper operation without replacing the device 1. The results on pulse ISO7637-2 2011 2a level IV depend mainly on load status and condition (open load, nominal load, shorted load, resistive load, inductive load, capacitive load). Lower ohmic loads with low inductive contribution help to increase the sustainable peak voltage for the device reaching Class C compliance. Tests performed on VND7020AJ-E, for example, give as result class C in the condition ON state with a resistive load equivalent to the nominal one on each output (see Figure 20); instead they give class E with Outputs in open load. |
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