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ADC08B200CIVS/NOPB Datasheet(PDF) 27 Page - Texas Instruments

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Part # ADC08B200CIVS/NOPB
Description  200 MSPS A/D Converter with Capture Buffer
PDF  39 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

ADC08B200CIVS/NOPB Datasheet(HTML) 27 Page - Texas Instruments

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ADC08B200
www.ti.com
SNAS388F – MARCH 2007 – REVISED APRIL 2013
The units of "L" must be compatible with the units of tPROP. This termination should be located as close as
possible to, but within one centimeter of, the ADC08B200 clock pin. Furthermore, this termination should be
beyond the receiving pin as seen from the clock source. For FR-4 board material, the value of C becomes
where
•
L is the length of the clock line in inches
(7)
The RESET Pin
A high level at this Reset input resets all control logic on the chip, including the buffer's read and write counters.
The FF output is reset low and the EF flag is reset high upon a device reset. Invoking a reset during the WRITE
phase can cause buffer data to be corrupted. A reset during the READ phase will stop the READ phase before it
is completed.
The RESET signal is asynchronous and should be at least 4 sample clock cycles wide. If no RESET is provided,
the chip generates its own internal reset signal at the beginning of the buffer write phase.
The OEDGE/TEN Pin
If this Output Edge Select input is high, the data outputs transition with the rising edge of the DRDY output. If this
input is low, the data outputs transition with the falling edge of the DRDY. Forcing a potential of VA/2 at this input
enables the Test Mode. There is an on-chip pull-up resistor at this pin, so the device interprets a floating input at
this pin to be a logic high. See TEST PATTERN OUTPUT for the output test pattern.
The OE Pin
A high level at this Output Enable input enables the output buffers. A low level at this input puts the digital data
output pins, including the DRDY output, into a high impedance state. The only exception is in the Test Pattern
Mode, where the OE input is ignored and the DRDY and data output pins are active regardless of the OE pin
status.
CAUTION
Although this device has a TRI-STATE output, maintaining optimum noise performance
requires keeping the capacitance on the data output pins as low as possible.
Therefore, it is never a good idea to connect the output pins to a bus. Each output pin
should be connected to a single input with lines as short as possible.
Buffer-Associated Pins
The on-chip buffer is 1 kilobyte (1,024 bytes) in size and is controlled through six (6) TTL-CMOS compatible
digital input pins.
THE RCLK PIN
When the capture buffer is enabled, the RCLK input is used to read the data from the buffer. The data output and
the EF flag transition with the rise of RCLK.
It is best to halt the RCLK when not reading the buffer to minimize its impact upon noise performance. RCLK
may be stopped in either the high or the low state.
THE WEN PIN
A high level at this Write Enable input causes data to be written into the capture buffer. One byte is written with
the rise of each sample clock. This input may go high asynchronously.
Copyright © 2007–2013, Texas Instruments Incorporated
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