ADC08B200

SNAS388F – MARCH 2007 – REVISED APRIL 2013

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CONVERTER TIMING CHARACTERISTICS (continued)

(1)(2)

Units

Parameter

Test Conditions

(Limits)

1.4

ns

Output Data Fall Time

(2.4V to 0.4V)

3.2

ns

4.0

ns (min)

Reading Buffer

7.0

RCLK Rising Edge to Data Output

11.7

ns (max)

Fall to 0.4V

Buffer bypassed, PLL disabled

5.5

ns

2.3

ns (min)

Reading Buffer

6.5

RCLK Rising Edge to Data Output

13.1

ns (max)

Rise to 2.5V

Buffer bypassed, PLL disabled

5.5

ns

RCLK Rising Edge to Data Output

2.4

ns (min)

Reading Buffer

3.8

Fall to 2.5V

5.5

ns (max)

RCLK Rising Edge to Data Output

2.6

ns (min)

Reading Buffer

4.5

Rise to 0.4V

6.9

ns (max)

Output Falling (2.4V to 0.4V)

1.5

V / ns

Output Slew Rate

Output Rising (0.4V to 2.5V)

2.3

V / ns

PLL Enabled

20

µs

PD Low to Device Active

PLL Bypassed

2

µs

PDADC Low to Device Active

2

µs

Pipeline Delay (Latency)

6

Clock Cycles

PLL on

3.4

ns

CLK Rise to

Sampling (Aperture) Delay

Acquisition of Data

PLL off

3.9

ns

PLL Bypassed

2

ps rms

Aperture Jitter

7

ps rms

(6)

Jitter with the PLL enabled is measured with 32k samples and the PLL in the x8 multiplication mode.

SPECIFICATION DEFINITIONS

APERTURE (SAMPLING) DELAY is that time delay after the rise of the sample clock until the input signal is

sampled within the ADC.

APERTURE JITTER is the variation in aperture delay from sample to sample. Aperture jitter shows up as input

noise.

CLOCK DUTY CYCLE is the ratio of the time that the clock waveform is at a logic high to the total time of one

clock period.

DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1

LSB. Measured at 200 MSPS with a ramp input.

EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE BITS) is another method of specifying Signal-to-Noise

and Distortion Ratio, or SINAD. ENOB is defined as (SINAD – 1.76) / 6.02 and says that the converter is

equivalent to a perfect ADC of this (ENOB) number of bits.

FULL POWER BANDWIDTH is a measure of the frequency at which the reconstructed output fundamental

drops 3 dB below its low frequency value for a full scale input.

is defined as:

where

•

(1)

INTEGRAL NON-LINEARITY (INL) is a measure of the deviation of each individual code from a line drawn from

10

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