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ADC08D1000EVAL Datasheet(PDF) 18 Page - National Semiconductor (TI) |
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ADC08D1000EVAL Datasheet(HTML) 18 Page - National Semiconductor (TI) |
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18 / 31 page ![]() 1.0 Functional Description The ADC08D1000 is a versatile A/D Converter with an inno- vative architecture permitting very high speed operation. The controls available ease the application of the device to circuit solutions. Optimum performance requires adherence to the provisions discussed here and in the Applications Informa- tion Section. While it is generally poor practice to allow an active pin to float, pins 4, 14 and 127 of the ADC08D1000 are designed to be left floating without jeopardy. In all discussions throughout this data sheet, whenever a function is called by allowing a pin to float, connecting that pin to a potential of one half the V A supply voltage will have the same effect as allowing it to float. 1.1 OVERVIEW The ADC08D1000 uses a calibrated folding and interpolating architecture that achieves over 7.5 effective bits. The use of folding amplifiers greatly reduces the number of comparators and power consumption. Interpolation reduces the number of front-end amplifiers required, minimizing the load on the input signal and further reducing power requirements. In addition to other things, on-chip calibration reduces the INL bow often seen with folding architectures. The result is an extremely fast, high performance, low power converter. The analog input signal that is within the converter’s input voltage range is digitized to eight bits at speeds of 200 MSPS to 1.6 GSPS, typical. Differential input voltages below negative full-scale will cause the output word to consist of all zeroes. Differential input voltages above positive full-scale will cause the output word to consist of all ones. Either of these conditions at either the "I" or "Q" input will cause the OR (Out of Range) output to be activated. This single OR output indicates when the output code from one or both of the channels is below negative full scale or above positive full scale. Each of the two converters has a 1:2 demultiplexer that feeds two LVDS output buses. The data on these buses provide an output word rate on each bus at half the ADC sampling rate and must be interleaved by the user to provide output words at the full conversion rate. The output levels may be selected to be normal or reduced. Using reduced levels saves power but could result in erro- neous data capture of some or all of the bits, especially at higher sample rates and in marginally designed systems. 1.1.1 Self-Calibration A self-calibration is performed upon power-up and can also be invoked by the user upon command. Calibration trims the 100 Ω analog input differential termination resistor and mini- mizes full-scale error, offset error, DNL and INL, resulting in maximizing SNR, THD, SINAD (SNDR) and ENOB. Internal bias currents are also set with the calibration process. All of this is true whether the calibration is performed upon power up or is performed upon command. Running the self calibra- tion is an important part of this chip’s functionality and is required in order to obtain adequate performance. In addi- tion to the requirement to be run at power-up, self calibration must be re-run whenever the sense of the FSR pin is changed. For best performance, we recommend that self calibration be run 20 seconds or more after application of power and whenever the operating ambient temperature changes more than 30˚C since calibration was last per- formed. See Section 2.4.2.2 for more information. Calibra- tion can not be initiated or run while the device is in the power-down mode. See Section 1.1.7 for information on the interaction between Power Down and Calibration. During the calibration process, the input termination resistor is trimmed to a value that is equal to R EXT / 33. This external resistor is located between pin 32 and ground. R EXT must be 3300 Ω ±0.1%. With this value, the input termination resistor is trimmed to be 100 Ω. Because R EXT is also used to set the proper current for the Track and Hold amplifier, for the preamplifiers and for the comparators, other values of R EXT should not be used. In normal operation, calibration is per- formed just after application of power and whenever a valid calibration command is given, which is holding the CAL pin low for at least 10 input clock cycles, then hold it high for at least another 10 input clock cycles. The time taken by the calibration procedure is specified in the A.C. Characteristics Table. Holding the CAL pin high upon power up will prevent the calibration process from running until the CAL pin expe- riences the above-mentioned 10 input clock cycles low fol- lowed by 10 cycles high. CalDly (pin 127) is used to select one of two delay times after the application of power to the start of calibration. This calibration delay is 2 25 input clock cycles (about 33.6 ms at 1 GSPS) with CalDly low, or 2 31 input clock cycles (about 2.15 seconds at 1 GSPS) with CalDly high. These delay values allow the power supply to come up and stabilize before calibration takes place. If the PD pin is high upon power-up, the calibration delay counter will be disabled until the PD pin is brought low. Therefore, holding the PD pin high during power up will further delay the start of the power-up calibration cycle. The best setting of the CalDly pin depends upon the power-on settling time of the power supply. The CalRun output is high whenever the calibration proce- dure is running. This is true whether the calibration is done at power-up or on-command. 1.1.2 Acquiring the Input Data is acquired at the falling edge of CLK+ (pin 18) and the digital equivalent of that data is available at the digital out- puts 13 input clock cycles later for the DI and DQ output buses and 14 input clock cycles later for the DId and DQd output buses. There is an additional internal delay called t OD before the data is available at the outputs. See the Timing Diagram. The ADC08D1000 will convert as long as the input clock signal is present. The fully differential comparator de- sign and the innovative design of the sample-and-hold am- plifier, together with self calibration, enables a very flat SINAD/ENOB response beyond 1.0 GHz. The ADC08D1000 output data signaling is LVDS and the output format is offset binary. 1.1.3 Control Modes Much of the user control can be accomplished with several control pins that are provided. Examples include initiation of the calibration cycle, power down mode and full scale range setting. However, the ADC08D1000 also provides an Ex- tended Control mode whereby a serial interface is used to access register-based control of several advanced features. The Extended Control mode is not intended to be enabled and disabled dynamically. Rather, the user is expected to employ either the normal control mode or the Extended Control mode at all times. When the device is in the Ex- tended Control mode, pin-based control of several features is replaced with register-based control and those pin-based www.national.com 18 |
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