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ADC08D1000EVAL Datasheet(PDF) 19 Page - National Semiconductor (TI) |
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ADC08D1000EVAL Datasheet(HTML) 19 Page - National Semiconductor (TI) |
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19 / 31 page ![]() 1.0 Functional Description (Continued) controls are disabled. These pins are OutV (pin 3), OutEdge/ DDR (pin 4), FSR (pin 14) and CalDly/DES (pin 127). See Section 1.2 for details on the Extended Control mode. 1.1.4 The Analog Inputs The ADC08D1000 must be driven with a differential input signal. Operation with a single-ended signal is not recom- mended. It is important that the inputs either be a.c. coupled to the inputs with the V CMO pin grounded or d.c. coupled with the V CMO pin not grounded and an input common mode voltage equal to the V CMO output. Two full-scale range settings are provided with pin 14 (FSR). A high on pin 14 causes an input full-scale range setting of 800 mV P-P, while grounding pin 14 causes an input full-scale range setting of 600 mV P-P. The full-scale range setting operates equally on both ADCs. In the Extended Control mode, the full-scale input range can be set to values between 560 mV P-P and 840 mVP-P through a serial interface. See Section 2.2 1.1.5 Clocking The ADC08D1000 must be driven with an a.c. coupled, differential clock signal. Section 2.3 describes the use of the clock input pins. A differential LVDS output clock is available for use in latching the ADC output data into whatever device is used to receive the data. The ADC08D1000 offers options for input and output clock- ing. These options include a choice of Dual Edge Sampling (DES) or interleaved mode where the ADC08D1000 per- forms as a single device converting at twice the input clock rate and a choice of which DCLK (DCLK) edge the output data transitions on and choice of Single Data Rate (SDR) or Double Data Rate (DDR) outputs. The ADC08D1000 also has the option to use a duty cycle corrected clock receiver as part of the input clock circuit. This feature is enabled by default and provides improved ADC clocking especially in the Dual-Edge Sampling mode (DES). 1.1.5.1 Dual-Edge Sampling The DES mode allows one of the ADC08D1000’s inputs (I or Q Channel) to be sampled by both ADCs. One ADC samples the input on the positive edge of the input clock and the other ADC samples the same input on the other edge of the input clock. A single input is thus sampled twice per input clock cycle, resulting in an overall sample rate of twice the input clock frequency, or 2 GSPS with a 1 GHz input clock. In this mode the outputs are interleaved such that the data is effectively demultiplexed 4:1. Since the sample rate is doubled, each of the 4 output buses have a 500 MSPS output rate with a 1 GHz input clock. All data is available in parallel. The four bytes of parallel data that is output with each clock is in the following sampling order, from the earli- est to the latest: DQd, DId, DQ, DI. Table 1 indicates what the outputs represent for the various sampling possibilities. In the non-extended mode of operation only the "I" input can be sampled in the DES mode. In the extended mode of operation the user can select which input is sampled. The ADC08D1000 also includes an automatic clock phase background calibration feature which can be used in DES mode to automatically and continuously adjust the clock phase of the I and Q channel. This feature removes the need to adjust the clock phase setting manually and provides optimal Dual-Edge Sampling ENOB performance. TABLE 1. Input Channel Samples Produced at Data Outputs Data Outputs (Always sourced with respect to fall of DCLK) Normal Sampling Mode Dual-Edge Sampling Mode I-Channel Selected Q-Channel Selected * DI "I" Input Sampled with Fall of CLK 13 cycles earlier. "I" Input Sampled with Fall of CLK 13 cycles earlier. "Q" Input Sampled with Fall of CLK 13 cycles earlier. DId "I" Input Sampled with Fall of CLK 14 cycles earlier. "I" Input Sampled with Fall of CLK 14 cycles earlier. "Q" Input Sampled with Fall of CLK 14 cycles earlier. DQ "Q" Input Sampled with Fall of CLK 13 cycles earlier. "I" Input Sampled with Rise of CLK 13.5 cycles earlier. "Q" Input Sampled with Rise of CLK 13.5 cycles earlier. DQd "Q" Input Sampled with Fall of CLK 14 14 CLK cycles after being sampled. "I" Input Sampled with Rise of CLK 14.5 cycles earlier. "Q" Input Sampled with Rise of CLK 14.5 cycles earlier. * Note that, in the Dual-Edge Sampling (DES) mode, the "Q" channel input can only be selected for sampling in the Extended Control Mode. 1.1.5.2 OutEdge Setting To help ease data capture in the SDR mode, the output data may be caused to transition on either the positive or the negative edge of the output data clock (DCLK). This is chosen with the OutEdge input (pin 4). A high on the Out- Edge input causes the output data to transition on the rising edge of DCLK, while grounding this input causes the output to transition on the falling edge of DCLK. See Section 2.4.3. 1.1.5.3 Double Data Rate A choice of single data rate (SDR) or double data rate (DDR) output is offered. With single data rate the output clock (DCLK) frequency is the same as the data rate of the two output buses. With double data rate the DCLK frequency is half the data rate and data is sent to the outputs on both input clock edges. DDR clocking is enabled by allowing pin 4 to float. www.national.com 19 |
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