Table 4.3. Insulation and Safety-Related Specifications

Parameter

Symbol

Test Condition

SOIC-8 Value

Unit

Nominal External Air Gap

(Clearance)

CLR

4.7

mm

Nominal External Tracking

(Creepage)

CPG

3.9

mm

Minimum Internal Gap

(Internal Clearance)

DTI

0.008

mm

Tracking Resistance

PTI

IEC60112

600

V

Erosion Depth

ED

0.04

mm

Resistance

(Input-Output)1

RIO

1012

Ω

Capacitance

(Input-Output)1

CIO

f = 1 MHz

0.5

pF

Input Capacitance2

CI

3.0

pF

Notes:

1. To determine resistance and capacitance, the Si875x is converted into a 2-terminal device. All pins on side 1 are shorted to

create terminal 1, and all pins on side 2 are shorted to create terminal 2. The parameters are then measured between these two

terminals.

2. Measured from input pin to ground.

Table 4.4. IEC 60664-1 Ratings

Parameter

Test Condition

SOIC-8 Specification

Basic Isolation Group

Material Group

I

Installation Classification

Rated Mains Voltages < 150 VRMS

I-IV

Rated Mains Voltages < 300 VRMS

I-III

Rated Mains Voltages < 400 VRMS

I-II

Rated Mains Voltages < 600 VRMS

I-II

Si8751/52 Data Sheet • Electrical Specifications

Skyworks Solutions, Inc. • Phone [781] 376-3000 • Fax [781] 376-3100 • sales@skyworksinc.com • www.skyworksinc.com

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206331A • Skyworks Proprietary Information • Products and Product Information are Subject to Change Without Notice • July 27, 2022

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