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900844 Datasheet(PDF) 42 Page - Freescale Semiconductor, Inc |
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900844 Datasheet(HTML) 42 Page - Freescale Semiconductor, Inc |
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42 / 118 page ![]() Analog Integrated Circuit Device Data 42 Freescale Semiconductor 900844 FUNCTIONAL DEVICE OPERATION SYSTEM CONTROL INTERFACE TEST MODES Test Mode Configuration During evaluation and testing, the IC can be configured for normal operation or test mode via the ICTEST pin and other register configurations. Details of Test mode programmability are not documented herein, but should be referenced from other Design for Test documentation. Test modes are for Freescale use only, and must not be accessed in applications. In test modes, signals are multiplexed on existing functional pins. The ICTEST pin must therefore be tied to ground (for normal operation) at the board level, in product applications Test mode also disables the thermal protection for high temperature op life testing. A proprietary protocol is included for scan chain test configurations, which reuses the SPI pins. In-package Trimming During IC final test, several parameters are trimmed in the package, such as the main bandgap, and other precision analog functions. Trim registers are for Freescale use only and must not be accessed in product applications. Fuse programming circuitry will be blocked during normal and test mode operation. Table 17. PLL Control Register Structure and Bit Description Name Bits Description FSLPLLCNTL (ADDR 0x1E4 - R/W - Default Value: 0x1B) PLLDIVIDE 2:0 PLL Divide Ratio and Effective VCO Frequency Settings x0 = 112, 3.670 MHz x1 = 116, 3.801 MHz x2 = 120, 3.932 MHz x3 = 124, 4.063 MHz x4 = 128, 4.194 MHz x5 = 132, 4.325 MHz x6 = 136, 4.456 MHz x7 = 140, 4.588 MHz PLL16MEN 3 16 MHz frequency enable x0 = 16 MHz clock disabled x1 = 16 MHz clock enabled and PLL enabled PLLEN 4 PLL Enable, even if there is no block requesting a clock x0 = PLL enabled based on device enables only x1 = PLL enabled Reserved 7:5 Reserved |
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