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ADT7462ACPZ-R7 Datasheet(PDF) 19 Page - ON Semiconductor |
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ADT7462ACPZ-R7 Datasheet(HTML) 19 Page - ON Semiconductor |
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19 / 81 page ![]() ADT7462 http://onsemi.com 19 constant current. Unfortunately, this technique requires calibration to cancel the effect of the absolute value of VBE, which varies from device to device. The technique used in the ADT7462 is to measure the change in VBE when the device is operated at three different currents. Previous devices have used only two operating currents; use of a third current allows automatic cancellation of any resistances in series with the external temperature sensor. Figure 33 shows the input signal conditioning used to measure the output of an external temperature sensor. This figure shows the external sensor as a substrate transistor, but it could equally be a discrete transistor. If a discrete transistor is used, the collector is not grounded and should be linked to the base. To prevent ground noise from interfering with the measurement, the more negative terminal of the sensor is not referenced to ground but is biased above ground by an internal diode at the D− input. C1 can optionally be added as a noise filter (recommended maximum value 1000 pF). However, a better option in noisy environments is to add a filter, as described in the Noise Filtering section. To measure DVBE, the operating current through the sensor is switched among three related currents. As shown in Figure 33, N1 × I and N2 × I are different multiples of the Current I. The currents through the temperature diode are switched between I and N1 × I, giving DVBE1, and then between I and N2 × I, giving DVBE2. The temperature can then be calculated using the two DVBE measurements. This method can also be shown to cancel the effect of any series resistance on the temperature measurement. The resulting DVBE waveforms are passed through a 65 kHz low−pass filter to remove noise and then to a chopper−stabilized amplifier. This amplifies and rectifies the waveform to produce a dc voltage proportional to DVBE. The ADC digitizes this voltage, and a temperature measurement is produced. To reduce the effects of noise, digital filtering is performed by averaging the results of 16 measurement cycles for low conversion rates. Signal conditioning and measurement of the internal temperature sensor are performed in the same manner (see Figure 33). Temperature Measurement Results The results of the local and remote temperature measurements are stored in the local and remote temperature value registers and are compared with limits programmed into the local and remote high and low limit registers. Table 8. Temperature Measurement Registers Temperature Value Register Address Local Temperature, LSB Register 0x88, Bits [7:6] Local Temperature, MSB Register 0x89 Remote 1 Temperature, LSB Register 0x8A, Bits [7:6] Remote 1 Temperature, MSB Register 0x8B Remote 2 Temperature, LSB Register 0x8C, Bits [7:6] Remote 2 Temperature, MSB Register 0x8D Remote 3 Temperature, LSB Register 0x8E, Bits [7:6] Remote 3 Temperature, MSB Register 0x8F Figure 33. Input Signal Conditioning C1* D+ BIAS DIODE *CAPACITOR C1 IS OPTIONAL. IT SHOULD ONLY BE USED IN NOISY ENVIRONMENTS. VCC TO ADC VOUT+ VOUT– REMOTE SENSING TRANSISTOR D– I N1 y I N2 y I IBIAS LOW−PASS FILTER fC = 65kHz The temperature value is stored in two registers. The MSB has a resolution of 1 °C. Only two bits in the temperature LSB register are used, Bit 7 and Bit 6, giving a temperature measurement resolution of 0.25 °C. The temperature measurement range for both local and remote measurements is from −64 °C to +191°C. However, the ADT7462 itself should never be operated outside its operating temperature range, which is from −40 °C to +125°C. For the remote diode, the user should refer to the data sheet of the diode. Table 9. Temperature Data Format Temperature Value MSB LSB −64°C 0000 0000 0000 0000 −50.25°C 0000 1110 0100 0000 −25°C 0010 0111 0000 0000 0°C 0100 0000 0000 0000 +25°C 0101 1001 0000 0000 +50.25°C 0111 0010 0100 0000 +100°C 1010 0100 0000 0000 |
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