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AN2950 Datasheet(PDF) 27 Page - STMicroelectronics |
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AN2950 Datasheet(HTML) 27 Page - STMicroelectronics |
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27 / 37 page ![]() AN2950 Testing the board Doc ID 15494 Rev 1 27/37 Figure 44. EPT thresholds The time window TEPT during which the extra power is allowed to be supplied can be chosen according to the following formula: Equation 2 The value of TEPT has to be chosen so as to prevent overheating of the VIPer28 and of the power elements (usually up to a few seconds). The EPT pin can be connected to GND if the function is not used. 2.10 Thermal measurements A thermal analysis of the board has been performed using an IR camera. The results are shown in Figure 45 for a 90 VAC mains input, full load condition. Figure 45. Thermal measurements at 90 VAC full load, Tamb = 25 °C EPT EPT EPT EPT V T I C ⋅ = |
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