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PM0020 Datasheet(PDF) 70 Page - STMicroelectronics |
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PM0020 Datasheet(HTML) 70 Page - STMicroelectronics |
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70 / 87 page ![]() ISC logic description PM00020 70/87 that drive the output pins are updated on the falling edge of the TCK in the Update-DR state. Input signals from external sources are sampled on the rising edge of TCK in the Capture- DR state. Typically, a SAMPLE/PRELOAD instruction is performed prior to EXTEST to pre- load the values, which will drive the component outputs. 12.5.6 INTEST The optional INTEST instruction places the IC in an internal boundary-test mode and selects the boundary-scan register to be connected between TDI and TDO. During this instruction, the boundary-scan register is accessed to drive test data on-chip via the boundary inputs and receive test data on-chip via the boundary outputs. 12.5.7 IDCODE Description: Shift out hardwired silicon signature Requirement: None Register: Device-ID Shift-In: 32 bits don't care Shift-Out: 32 bits ID-Code Mode: ISC and PSD Security: Fully functional Table 32. IDCODE sequence Step Tap activity Comment 0 Run-Test/Idle Start 1 IR-Scan Load IDCODE 2 DR-Scan IDCODE shift out 3 Run-Test/Idle End |
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