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TLV3011AMDBVREP Datasheet(PDF) 4 Page - Texas Instruments

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Part # TLV3011AMDBVREP
Description  TLV3011-EP and TLV3012-EP Enhanced Product Low Power Comparators With Integrated 1.24V Voltage Reference
PDF  34 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

TLV3011AMDBVREP Datasheet(HTML) 4 Page - Texas Instruments

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6 Specifications
6.1 Absolute Maximum Ratings - TLV3011-EP
over operating free-air temperature range (unless otherwise noted)(1)
MIN
MAX
UNIT
Supply voltage
7
V
Signal input terminals
Voltage(2)
–0.5
(V+) +0.5
V
Current(2)
±10
mA
Output short circuit(3)
Continous
Operating temperature range
–55
125
°C
Tstg
Storage temperature range
–65
150
°C
TJ
Junction temperature
150
°C
(1)
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
All voltage values are with respect to the network ground terminal.
(3)
Short circuit to ground
6.2 Absolute Maximum Ratings - TLV3012-EP
over operating free-air temperature range (unless otherwise noted)(1)
MIN
MAX
UNIT
Supply voltage: VS = (V+) – (V–)
–0.5
7
V
Input pins (IN+, IN–) from (V–)(2)
–0.5
7
V
Output (OUT) (Push-Pull) from (V–)
–0.5
(V+) + 0.5
V
Output short circuit current(3)
10
mA
Junction temperature, TJ
150
°C
Storage temperature, Tstg
–65
150
°C
(1)
Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully
functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
(2)
Input pins are diode-clamped to (V–). Inputs (IN+, IN–) can be greater than (V+) as long as within the –0.5 V to 7 V range. Inputs
beyond –0.3 V must be current-limited to less than –10 mA, while inputs beyond 7 V must be externally voltage clamped.
(3)
Short-circuit to (V–) or (V+).
6.3 ESD Ratings
VALUE
UNIT
V(ESD)
Electrostatic
discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
±2000
V
Charged-device model (CDM), per ANSI/ESDA/JEDEC JS-002(2) (TLV3012-EP Only)
±1000
(1)
JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process.
(2)
JEDEC document JEP157 states that 250 V CDM allows safe manufacturing with a standard ESD control process.
TLV3011-EP, TLV3012-EP
SGLS349A – OCTOBER 2006 – REVISED MAY 2023
www.ti.com
4
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Copyright © 2023 Texas Instruments Incorporated
Product Folder Links: TLV3011-EP TLV3012-EP



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