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TLV3011AMDBVREP Datasheet(PDF) 4 Page - Texas Instruments |
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TLV3011AMDBVREP Datasheet(HTML) 4 Page - Texas Instruments |
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4 / 34 page ![]() 6 Specifications 6.1 Absolute Maximum Ratings - TLV3011-EP over operating free-air temperature range (unless otherwise noted)(1) MIN MAX UNIT Supply voltage 7 V Signal input terminals Voltage(2) –0.5 (V+) +0.5 V Current(2) ±10 mA Output short circuit(3) Continous Operating temperature range –55 125 °C Tstg Storage temperature range –65 150 °C TJ Junction temperature 150 °C (1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltage values are with respect to the network ground terminal. (3) Short circuit to ground 6.2 Absolute Maximum Ratings - TLV3012-EP over operating free-air temperature range (unless otherwise noted)(1) MIN MAX UNIT Supply voltage: VS = (V+) – (V–) –0.5 7 V Input pins (IN+, IN–) from (V–)(2) –0.5 7 V Output (OUT) (Push-Pull) from (V–) –0.5 (V+) + 0.5 V Output short circuit current(3) 10 mA Junction temperature, TJ 150 °C Storage temperature, Tstg –65 150 °C (1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions. If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime. (2) Input pins are diode-clamped to (V–). Inputs (IN+, IN–) can be greater than (V+) as long as within the –0.5 V to 7 V range. Inputs beyond –0.3 V must be current-limited to less than –10 mA, while inputs beyond 7 V must be externally voltage clamped. (3) Short-circuit to (V–) or (V+). 6.3 ESD Ratings VALUE UNIT V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2000 V Charged-device model (CDM), per ANSI/ESDA/JEDEC JS-002(2) (TLV3012-EP Only) ±1000 (1) JEDEC document JEP155 states that 500 V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250 V CDM allows safe manufacturing with a standard ESD control process. TLV3011-EP, TLV3012-EP SGLS349A – OCTOBER 2006 – REVISED MAY 2023 www.ti.com 4 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated Product Folder Links: TLV3011-EP TLV3012-EP |
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