TMS320F28375DPZP datasheet(205/226 Pages) TI

205 / 226 page

Two application reports offer details about how to develop functionally safe systems with C2000 real-time control

devices:

• C2000™ Hardware Built-In Self-Test discusses the HWBIST safety mechanism, along with its functions and

features, in the F2807x/F2837xS/F2837xD series of C2000 devices. The report also addresses some

system-level considerations when using the HWBIST feature and explains how customers can use the

diagnostic library on their system.

• C2000™ CPU Memory Built-In Self-Test describes embedded memory validation using the C28x central

processing unit (CPU) during an active control loop. It discusses system challenges to memory validation as

well as the different solutions provided by C2000 devices and software. Finally, it presents the Diagnostic

Library implementations for memory testing.

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TMS320F28379D, TMS320F28379D-Q1, TMS320F28378D, TMS320F28377D

TMS320F28377D-Q1, TMS320F28376D, TMS320F28375D, TMS320F28374D

SPRS880O – DECEMBER 2013 – REVISED FEBRUARY 2021

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Product Folder Links: TMS320F28379D TMS320F28379D-Q1 TMS320F28378D TMS320F28377D

TMS320F28377D-Q1 TMS320F28376D TMS320F28375D TMS320F28374D

TMS320F28375DPZP Datasheet(PDF) 205 Page - Texas Instruments