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AT24C01D Datasheet(PDF) 15 Page - ATMEL Corporation

Part # AT24C01D
Description  IC-Compatible (2-wire) Serial EEPROM
PDF  26 Pages
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Manufacturer  ATMEL [ATMEL Corporation]
Direct Link  http://www.atmel.com
Logo ATMEL - ATMEL Corporation

AT24C01D Datasheet(HTML) 15 Page - ATMEL Corporation

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AT24C01D and AT24C02D [DATASHEET]
Atmel-8871B-SEEPROM-AT24C01D-02D-Datasheet_032014
15
8.5
Pin Capacitance(1)
Note:
1.
This parameter is characterized but is not 100% tested in production.
8.6
Power-Up Requirements and Reset Behavior
During a power-up sequence, the VCC supplied to the AT24C01D/02D should monotonically rise from GND to the
minimum VCC level as specified in Section 8.2 with no greater than a slew rate of 1V/μs.
8.6.1
Device Reset
To prevent Write operations or other spurious events from happening during a power-up sequence, the
AT24C01D/02D includes a Power-On-Reset (POR) circuit. Upon power-up, the device will not respond to any
commands until the VCC level crosses the internal voltage threshold (VPOR) that brings the device out of reset and
into standby mode.
The system designer must ensure that instructions are not sent to the device until the VCC supply has reached a
stable value greater than or equal to the minimum VCC level. Additionally, once the VCC is greater than or equal to
the minimum VCC level, the bus Master must wait at least tPUP before sending the first command to the device. See
Table 8-1 for the values associated with these power-up parameters.
Table 8-1.
Power-up Conditions
If an event occurs in the system where the VCC level supplied to the AT24C01D/02D drops below the maximum
VPOR level specified, it is recommended that a full power cycle sequence be performed by first driving the VCC pin
to GND, waiting at least the minimum tPOFF time, and then performing a new power-up sequence in compliance
with the requirements defined in this section.
8.7
EEPROM Cell Performance Characteristics
Notes: 1.
Write endurance performance is determined through characterization and the qualification process.
2.
The data retention capability is determined through qualification and checked on each device in production.
Applicable over recommended operating range from TA = 25C, f = 1.0MHz, VCC = 3.6V
Symbol
Test Condition
Max
Units
Conditions
CI/O
Input/Output Capacitance (SDA)
8
pF
VI/O = 0V
CIN
Input Capacitance (A0, A1, A2, SCL)
6
pF
VIN = 0V
Symbol
Parameter
Min
Max
Units
tPUP
Time required after VCC is stable before the device can accept commands.
100
μs
VPOR
Power-On Reset Threshold Voltage
1.5
V
tPOFF
Minimum time at VCC = 0V between power cycles.
1
ms
Operation
Test Condition
Min
Max
Units
Write Endurance(1)
TA = 25°C, VCC(min)< VCC <VCC(max)
Byte or Page Write Mode
1,000,000
—
Write Cycles
Data Retention(2)
TA = 55°C
100
—
Years



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