| Electronic Components Datasheet Search |
|
AT24C01D Datasheet(PDF) 15 Page - ATMEL Corporation |
|
|
|||||||||||||||||||||||||||||
AT24C01D Datasheet(HTML) 15 Page - ATMEL Corporation |
|
15 / 26 page ![]() AT24C01D and AT24C02D [DATASHEET] Atmel-8871B-SEEPROM-AT24C01D-02D-Datasheet_032014 15 8.5 Pin Capacitance(1) Note: 1. This parameter is characterized but is not 100% tested in production. 8.6 Power-Up Requirements and Reset Behavior During a power-up sequence, the VCC supplied to the AT24C01D/02D should monotonically rise from GND to the minimum VCC level as specified in Section 8.2 with no greater than a slew rate of 1V/μs. 8.6.1 Device Reset To prevent Write operations or other spurious events from happening during a power-up sequence, the AT24C01D/02D includes a Power-On-Reset (POR) circuit. Upon power-up, the device will not respond to any commands until the VCC level crosses the internal voltage threshold (VPOR) that brings the device out of reset and into standby mode. The system designer must ensure that instructions are not sent to the device until the VCC supply has reached a stable value greater than or equal to the minimum VCC level. Additionally, once the VCC is greater than or equal to the minimum VCC level, the bus Master must wait at least tPUP before sending the first command to the device. See Table 8-1 for the values associated with these power-up parameters. Table 8-1. Power-up Conditions If an event occurs in the system where the VCC level supplied to the AT24C01D/02D drops below the maximum VPOR level specified, it is recommended that a full power cycle sequence be performed by first driving the VCC pin to GND, waiting at least the minimum tPOFF time, and then performing a new power-up sequence in compliance with the requirements defined in this section. 8.7 EEPROM Cell Performance Characteristics Notes: 1. Write endurance performance is determined through characterization and the qualification process. 2. The data retention capability is determined through qualification and checked on each device in production. Applicable over recommended operating range from TA = 25C, f = 1.0MHz, VCC = 3.6V Symbol Test Condition Max Units Conditions CI/O Input/Output Capacitance (SDA) 8 pF VI/O = 0V CIN Input Capacitance (A0, A1, A2, SCL) 6 pF VIN = 0V Symbol Parameter Min Max Units tPUP Time required after VCC is stable before the device can accept commands. 100 μs VPOR Power-On Reset Threshold Voltage 1.5 V tPOFF Minimum time at VCC = 0V between power cycles. 1 ms Operation Test Condition Min Max Units Write Endurance(1) TA = 25°C, VCC(min)< VCC <VCC(max) Byte or Page Write Mode 1,000,000 — Write Cycles Data Retention(2) TA = 55°C 100 — Years |
|
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |