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AN3077 Datasheet(PDF) 43 Page - STMicroelectronics

Part # AN3077
Description  Safety application guide
PDF  82 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN3077 Datasheet(HTML) 43 Page - STMicroelectronics

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AN3077
Functional safety requirements for application software
81
●
ADC0_SWTEST_REGCRC
If ADC_0 is used, the ADC_0 configuration registers are read and CRC checksum is
computed. The checksum is compared to the expected value.
●
ADC1_SWTEST_REGCRC
If ADC_1 is used, the ADC_1 configuration registers are read and CRC checksum is
computed. The checksum is compared to the expected value.
●
SIUL_SWTEST_REGCRC
The SIUL configuration registers are read and a CRC checksum is computed. The
checksum is compared to the expected value.
3.15.1.1.5
Implementation details
The following hardware elements shall be used for the safety function:
●
Analog input channels AN[0:8] of ADC_0
●
Analog input channels AN[11:14] of ADC_0 and ADC_1 (shared channels)
●
Analog input channels AN[0:8] of ADC_1
The user must select one channel from ADC_0 or from ADC_1. Shared channels can be
used.
Mandatory: The input pads are configured via the appropriate pad configuration registers
(PCRn) in the SIUL module.
3.15.1.2
Double Read Analog Inputs
3.15.1.2.1
Hardware elements
The Double Read Analog Input uses two analog input channels to acquire a replicated
analog input signal. Both ADC units acquire and digitize the two copies of a redundant
analog signal connected to the inputs. In this configuration (if applied to all possible analog
inputs), only half of the analog inputs are available to the applications (AN[0:8] of ADC_0 for
signals, and AN[0:8] of ADC_1 for signal copies).
Table 11. Software BIST and/or test
Software BIST and/or test
Frequency
SUPPLY SELF-TEST
Once in the FTTI
RESISTIVE-CAPACITIVE SELF-TEST
Once in the FTTI
CAPACITIVE SELF-TEST
Once in the FTTI
ADC_SWTEST_TEST1
Once in the FTTI
ADC_SWTEST_TEST2
Once in the FTTI
ADC_SWTEST_VALCHK
Once for every acquisition
ADC_SWTEST_OVERSAMPLING
Once for every acquisition
ADC0_SWTEST_REGCRC
Once in the FTTI
ADC1_SWTEST_REGCRC
Once in the FTTI
SIUL_SWTEST_REGCRC
Once in the FTTI



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