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MCP48CMB02 Datasheet(PDF) 98 Page - Microchip Technology

Part # MCP48CMB02
Description  8/10/12-Bit Digital-to-Analog Converters, 1 LSb INL Single/Dual Voltage Outputs with SPI Interface
PDF  106 Pages
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Manufacturer  MICROCHIP [Microchip Technology]
Direct Link  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

MCP48CMB02 Datasheet(HTML) 98 Page - Microchip Technology

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MCP48CXBXX
DS20006160A-page 98
 2019 Microchip Technology Inc.
B.5
Zero-Scale Error (EZS)
The Zero-Scale Error (see Figure B-2) is the difference
between the ideal and measured VOUT voltage with the
DAC register code equal to 000h (Equation B-3). The
error is dependent on the resistive load on the VOUT pin
(and where that load is tied to, such as VSS or VDD). For
loads (to VDD) greater than specified, the Zero-Scale
Error is greater.
The error in bits is determined by the theoretical voltage
step size to give an error in LSb.
EQUATION B-3:
ZERO SCALE ERROR
B.6
Total Unadjusted Error (ET)
The Total Unadjusted Error (ET) is the difference
between the ideal and measured VOUT voltage.
Typically, calibration of the output voltage is
implemented to improve the system’s performance.
The error in bits is determined by the theortical voltage
step size to give an error in LSb.
Equation B-4 shows the Total Unadjusted Error
calculation
EQUATION B-4:
TOTAL UNADJUSTED
ERROR CALCULATION
B.7
Offset Error (EOS)
The Offset Error is the delta voltage of the VOUT
voltage from the ideal output voltage at the specified
code. This code is specified where the output amplifier
is in the linear operating range; for the MCP48CXBXX
we specify code 64 (decimal). Offset Error does not
include gain error, which is illustrated in Figure B-2.
This error is expressed in mV. Offset Error can be
negative or positive. The error can be calibrated by
software in application circuits.
FIGURE B-2:
OFFSET ERROR (ZERO
GAIN ERROR).
B.8
Offset Error Drift (EOSD)
The Offset Error Drift is the variation in Offset Error due
to a change in ambient temperature. The Offset Error
Drift is typically expressed in ppm/°C or µV/°C.
B.9
Gain Error (EG)
Gain Error is a calculation based on the ideal slope
using the voltage boundaries for the linear range of the
output driver (e.g., code 64 and code 4032) (see
Figure B-3). The Gain Error calculation nullifies the
device’s Offset Error.
The Gain Error indicates how well the slope of the
actual transfer function matches the slope of the ideal
transfer function. The Gain Error is usually expressed
as a percentage of full-scale range (% of FSR) or in
LSb. FSR is the ideal full-scale voltage of the DAC (see
Equation B-5).
Where:
EFS is expressed in LSb.
VOUT(@ZS) is the VOUT voltage when the DAC
register code is at Zero-Scale.
VLSb(IDEAL) is the theoretical voltage step size.
EZS
VOUT(@ZS)
VLSb(IDEAL)
----------------------------
=
Where:
ET is expressed in LSb.
VOUT_Actual(@code) = The measured DAC
output voltage at the
specified code
VOUT_Ideal(@code) = The calculated DAC
output voltage at the
specified code
( code * VLSb(Ideal) )
VLSb(Ideal) =VREF/# Steps
12-bit = VREF/4096
10-bit = VREF/1024
8-bit = VREF/256
ET
VOUT_Actual(@code) VOUT_Ideal(@code)
–

VLSb Ideal

--------------------------------------------------------------------------------------------------
=
Ideal Transfer
Actual
DAC Input Code
0
Zero-Scale
Error (EZS)
Offset
Function
64
4032
Error (EOS)
Transfer
Function



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