CLRC63201TSLASH0FE datasheet(142/163 Pages) PHILIPS

142 / 163 page

Philips Semiconductors

Product Specification Rev. 3.0; May 2003

Multiple Protocol Contactless Reader IC

CL RC632

142

Confidential

21 TEST SIGNALS

21.1 General

The CL RC632 allows different kind of signal measurements. These measurements can be used to check

the internally generated and received signals using the possibilities of the serial signal switch as described in

chapter 15.

Furthermore, with the CL RC632 the user may select internal analogue signals to measure them at pin AUX

and internal digital signals to observe them on pin MFOUT by register selections. These measurements can

be helpful during the design-in phase to optimise the receiver’s behaviour or for test purpose.

21.2 Measurements Using the Serial Signal Switch

Using the serial signal switch at pin MFOUT the user may observe data send to the card or data received

from the card. The following tables give an overview of the different signals available.

SignalToMFOUT

MFOUTSelect

Signal routed to MFOUT pin

LOW

HIGH

Envelope

Transmit NRZ

Manchester with Subcarrier

Manchester

RFU

Digital Test signal

Table 21-1 Signal routed to MFOUT pin

Note: The routing of the Manchester and the Manchester with Subcarrier signal to the MFOUT is only

possible at 106 kbaud according to ISO14443A.

CLRC63201T/0FE Datasheet(PDF) 142 Page - NXP Semiconductors