CLRC63201TSLASH0FE datasheet(146/163 Pages) PHILIPS

146 / 163 page

Philips Semiconductors

Product Specification Rev. 3.0; May 2003

Multiple Protocol Contactless Reader IC

CL RC632

146

Confidential

21.4 Digital Test-Signals

Digital test signals may be routed to pin MFOUT by setting bit SignalToMFOUT to 1. A digital test signal may

be selected via the register bits TestDigiSignalSel in Register TestDigiSelect.

The signals selected by a certain TestDigiSignalSel setting is shown in the table below:

TestDigiSignalSel

Signal Name

Description

F4hex

s_data

Data received from the card.

E4hex

s_valid

Shows with 1, that the signals s_data and s_coll are valid.

D4hex

s_coll

Shows with 1, that a collision has been detected in the current bit.

C4hex

s_clock

Internal serial clock: during transmission, this is the coder-clock and during

reception this is the receiver clock.

B5hex

rd_sync

Internal synchronised read signal (derived from the parallel µ-Processor

interface).

A5hex

wr_sync

Internal synchronised write signal (derived from the parallel µ-Processor

interface).

96hex

int_clock

Internal 13.56 MHz clock.

83hex

BPSK_out

BPSK signal output

E2hex

BPSK_sig

BPSK signal’s amplitude detected

00hex

no test signal

output as defined by MFOUTSelect are routed to pin MFOUT.

Table 21-3: Digital Test Signal Selection

If no test signals are used, the value for the TestDigiSelect-Register shall be 00hex.

Note: All other values of TestDigiSignalSel are for production test purposes only.

CLRC63201T/0FE Datasheet(PDF) 146 Page - NXP Semiconductors

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