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STM32WBA62CGF6 Datasheet(PDF) 139 Page - STMicroelectronics

Part # STM32WBA62CGF6
Description  Multiprotocol wireless 32-bit MCU Arm®-based Cortex®-M33 with TrustZone , FPU, Bluetooth IEEE802.15.4 radio solution
PDF  185 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
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STM32WBA62CGF6 Datasheet(HTML) 139 Page - STMicroelectronics

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DS14736 Rev 1
139/185
STM32WBA6xxx
Electrical characteristics
169
5.3.16
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDD (for standard, 3.3 V-capable I/O pins) should be avoided during normal product
operation. However, in order to give an indication of the robustness of the microcontroller if
abnormal injection accidentally happens, some susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibility to I/O current injection
While a simple application is executed, the device is stressed by injecting current into the
I/O pins programmed in floating input mode. While current is injected into the I/O pin, one at
a time, the device is checked for functional failures.
The failure is indicated by an out-of-range parameter, such as an ADC error above a certain
limit (higher than 5 LSB ET), out of conventional limits of induced leakage current on
adjacent pins (out of the -5 µA/0 µA range) or other functional failure (for example reset
occurrence or oscillator frequency deviation).
The characterization results are given in Table 74. The negative/positive induced leakage
current is caused by the negative/positive injection.
5.3.17
I/O port characteristics
General input/output characteristics
The parameters given in Table 75 are derived from tests performed at ambient temperature
and under the supply voltage conditions summarized in Table 30. All I/Os are designed as
CMOS- and TTL-compliant.
Note:
For information on I/O configuration, refer to AN4899 “STM32 GPIO configuration for
hardware settings and low-power consumption”.
1. Evaluated by characterization, not tested in production, unless otherwise specified.
Table 74. I/O current injection susceptibility(1)
1. Evaluated by characterization, not tested in production, unless otherwise specified.
Symbol
Description
Functional susceptibility
Unit
Negative injection
Positive injection
IINJ
Injected current on all pins
5
N/A
mA
Table 75. I/O static characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VIL
I/O input
low level voltage
1.58 V ≤ VDD ≤ 3.6 V,
1.08 V ≤ VDDIO2 ≤ 3.6 V
-
-
0.3 x VDD
V
VIH
I/O input
high level voltage
0.7 x VDD
--
Vhys(1) Input hysteresis
-
-
250
-
mV



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