STM32WBA62CGF6 datasheet(136/185 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32WBA6xxx

136/185

DS14736 Rev 1

5.3.14

EMC characteristics

Susceptibility tests are performed on a sample basis during device characterization.

Functional EMS (electromagnetic susceptibility)

While a simple application is executed on the device (toggling two LEDs through I/O ports),

the device is stressed by two electromagnetic events until a failure occurs. The failure is

indicated by the LEDs as follows:

•

ESD (electrostatic discharge), positive and negative: applied to all device pins until a

functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.

•

FTB (fast transient voltage burst), positive and negative: applied to VDD and VSS pins

through a 100 pF capacitor, until a functional disturbance occurs. This test is compliant

with the IEC 61000-4-4 standard.

A device reset allows normal operations to be resumed.

IDD(4)

Average consumption from VDD

Write mode

2.1

Erase mode

1.3

Maximum current (peak) from VDD

Write mode

2.6

Erase mode

3.0

1. Evaluated by characterization after cycling, not tested in production.

2. Specified by design, not tested in production, unless otherwise specified.

3. Erase time applies to all pages in user area in flash main memory (only 32 pages can be cycled more than 10 k times)

4. Evaluated by characterization, not tested in production, unless otherwise specified.

Table 68. Flash memory characteristics (continued)

Symbol

Parameter

Conditions

Typ

Max(1)

Unit

Table 69. Flash memory endurance and data retention(1)

Symbol

Parameter

Conditions

Min

Unit

NEND

Endurance

Whole user flash

TA = –40 to 105 °C

kcycles

Limited to 32 pages per bank

100

tRET

Data retention(2)

Whole bank

TA = 85 °C after 1 kcycles

TA = 105 °C after 1 kcycles

TA = 55 °C after 10 kcycles

TA = 85 °C after 10 kcycles

TA = 105 °C after 10 kcycles

Limited to 32 pages per bank

TA = 55 °C after 100 kcycles

TA = 85 °C after 100 kcycles

TA = 105 °C after 100 kcycles

1. Evaluated by characterization, not tested in production, unless otherwise specified.

2. Cycling performed over the whole temperature range.

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