ADF5902

Data Sheet

Rev. 0 | Page 20 of 39

DB31 DB30 DB29 DB28 DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7

DB6 DB5 DB4 DB3 DB2

DB1

DB0

0

0

0

0

0

0

0

0

AB9 AB8

AB7 AB6 AB5 AB4 AB3 AB2 AB1 AB0

C4(0) C3(1) C2(0) C1(0)

CONTROL

BITS

RESERVED

0

0

0

0

AB14 AB13 AB12 AB11 AB10

RAMP STATUS/ANALOG TEST BUS

C5(0)

AB3 AB2 AB1 AB0

00

0

0

00

0

0

ANALOG TEST BUS

AB7 AB6 AB5 AB4

00

0

0

11

0

0

AB9 AB8

00

00

NONE

RAMP COMPLETE TO MUXOUT

00

0

00

0

00

00

00

0

0

00

1

1

00

0

0

00

0

0

01

01

RAMP DOWN TO MUXOUT

TEMPERATURE SENSOR TO ATEST

00

0

00

1

00

00

00

1

1

00

0

0

01

TEMPERATURE SENSOR TO ADC

10

0x0503

0x0100

0x00C0

0x0903

0x0000

AB11 AB10

AB12

AB13

AB14

0

0

0

Figure 28. Register 4 (R4)

REGISTER 4

Control Bits

With Bits[C5:C1] set to 00100, Register R4 is programmed.

Figure 28 shows the input data format for programming this

register.

Reserved

Bits[DB31:DB20] are reserved and must be set as shown in

Figure 28.

Ramp Status/Analog Test Bus

Bits[DB19:DB5] control the analog test bus and the ramp status

to MUXOUT (see Figure 28).

The analog test bus allows access to internal test signals for the

temperature sensor which can be connected to the ATEST pin

or the internal ADC.

Setting Bits DB[19:5] to 0 (no value) sets the ATEST pin to high

impedance.

For ramp status outputs on MUXOUT, the MUXOUT bits in

Register R3 (Bits[DB15:DB12]) must be set to 1111 to access

these modes.