BQ76PL455APFCT datasheet(7/125 Pages) TI1

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bq76PL455A

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SLUSCL0A – SEPTEMBER 2016 – REVISED OCTOBER 2016

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(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

Unless otherwise noted, voltages are given with respect to device commons (AGND1–3, DGND1–3, CGND) tied together (device VSS

or GND).

(3)

Specified by design, not tested in production.

(4)

Must meet all stated conditions for the TOP pin at all times.

(5)

Must short the highest-connected cell to the unused VSENSEn inputs above it in configurations that use < 16 cells. For example, a 14-

cell configuration must short pins VSENSE14, VSENSE15, VSENSE16.

6 Specifications

6.1 Absolute Maximum Ratings

over specified Ambient Temperature range (unless otherwise noted)

(1) (2)

MIN

MAX

UNIT

–0.3

VDIG

–0.3

VIO

–0.3

AUX0–7

Lesser of two MAX values

–0.3

6 or (VP + 0.3)

COMMH+, COMMH–, COMML+, COMMH–,

FAULTH+, FAULTH–, FAULTL+, FAULTL–

Lesser of two MAX values

–0.3

6 or (V5VAO + 0.3)

AC pulse specification(3) for these eight

pins only:

Vpk maximum ≤ 6.5 V for 100 ns or less,

100 kHz

≤ f ≤ 400 MHz

–0.3

6.5

Vpk

GPIO0–5

Lesser of two MAX values

–0.3

6 or (VIO + 0.3)

Lesser of two MAX values

–0.3

6 or (VIO + 0.3)

TOP (4)

–0.3

TOP to VSENSE16 delta(4)(5)

(VSENSE16 + 5.5 V)

≥ TOP ≥

(VSENSE16 – 1 V)

(VSENSE16 + 5.5 V)

VSENSE0

–0.3

0.3

VSENSEn – VSENSEn–1

n = 1 to 16

–0.3

5.5

n = 1 to 16, 0.1% duty cycle

–0.3

6.5

WAKEUP

–0.3

Ambient free-air temperature, TA

–40

105

⁰C

Junction temperature, TJ

–40

125

⁰C

Storage temperature, Tstg

–65

150

°C

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

6.2 ESD Ratings

VALUE

UNIT

V(ESD) Electrostatic discharge

Human-body model (HBM), per

ANSI/ESDA/JEDEC JS-001(1)

All pins

±2000

Charged-device model (CDM),per JEDEC

specification JESD22-C101(2)

All pins except 1, 20, 21, 40, 41, 60, 61,

76, and 80

±500

Pin 76

±450

Corner pins (1, 20, 21, 40, 41, 60, 61,

and 80)

±750

BQ76PL455APFCT Datasheet(PDF) 7 Page - Texas Instruments

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