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BQ76PL455APFCT Datasheet(PDF) 12 Page - Texas Instruments |
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BQ76PL455APFCT Datasheet(HTML) 12 Page - Texas Instruments |
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12 / 125 page ![]() 12 bq76PL455A SLUSCL0A – SEPTEMBER 2016 – REVISED OCTOBER 2016 www.ti.com Product Folder Links: bq76PL455A Submit Documentation Feedback Copyright © 2016, Texas Instruments Incorporated (1) Specified by design, not tested in production. 6.17 Digital Input/Output: Daisy Chain Vertical Bus PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VOH_DCC_TX Logic level output voltage high Single driver loaded, ILOAD = 5 mA VDIG −1 VDIG V VOL_DCC_TX Logic level output voltage low Single driver loaded, ILOAD = 5 mA GND 1 V TPD Internal propagation delay, COMML to COMMH(1) <60 ns TDCC_BIT_TIME Diff. Comms. Bit Time(1) 250 ns fWAKE_TONE WAKE TONE frequency(1) 50% duty-cycle WAKE TONE transmitted on differential pins COMMH+/COMMH– 100 kHz tWAKE TONE WAKE TONE duration(1) WAKE TONE transmitted on differential pins COMMH+/COMMH– 1 ms (1) Pulses shorter than 100 µs may wake the device, but must maintain 100 µs to assure start up. (2) Environmental noise may affect tone detection. (3) Specified by design, not tested in production. 6.18 Digital Input/Output: Wakeup PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIH_WAKEUP WAKEUP high-input voltage 2.3 V VIL_WAKEUP WAKEUP low-input voltage 0.7 V tWAKEUP_HOLD (1) WAKEUP hold time (high-pulse width) Pulse driven 0-1-0 100 µs tWAKEUP_DLY Delay between WAKEUP pin assertion and WAKETONE transmission Typical application circuit with typical components as outlined in the Application and Implementation section. 1.2 ms tWAKE TONE DELAY_DC Delay (2) between start of WAKETONE received and WAKETONE transmission After POR exit condition [VDD18VO > 1.7 V] is met. 1.2 ms tWAKEUP_TO_DCOMM Required delay from WAKETONE transmission to ready for differential communications (3) 1.1 ms tWAKEUP_TO_UART Required delay from WAKETONE transmission to ready for UART communications (3) 200 µs (1) Program EEPROM temperature (TA ) between 0°C and 30°C. (2) Specified by design, not tested in production. (3) Erase / Program cycles not to exceed EECYCLES. 6.19 EEPROM over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT EEPGM (1) EEPROM total program time(2) No writes to the device are allowed during the programming cycle 210 500 ms EECYCLES Erase / Program cycles(2) 5 cycles EERETN Data retention(2)(3) 10 years (1) Normal range specification. Ranges can be extended by using the COMP_UV[CMP_TST_SHF_UV] and COMP_OV[CMP_TST_SHF_OV] bits. See register bit description in Table 7 for additional details. 6.20 Secondary Protector – Window Comparators over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT OVRANGE Over-voltage comparator register set-point limits (1) 2 5.175 V UVRANGE Under-voltage comparator register set-point limits (1) 0.7 3.875 V OVUVSTEP Threshold step resolution 25 mV ERRCMP_UV Total UV threshold error (includes ERRVCOMP_REF_45) Vin = 0.7 to 3.875 V –50 50 mV ERRCMP_UV_EXT UV threshold error when range-extend bit is set COMP_UV[CMP_TST_SHF_UV] = 1 –100 100 mV ERRCOMP_OV Total OV threshold error (includes ERRVCOMP_REF_45) Vin = 2 to 5.175 V –50 50 mV ERRCOMP_OV_EXT OV threshold error when range-extend bit is set COMP_UV[CMP_TST_SHF_OV] = 1 –60 60 mV VCOMP_HYST Threshold hysteresis Hysteresis enabled; DEVCONFIG[COMP_HYST_EN] = 1 50 85 130 mV |
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