FS32R274VBK2MMM datasheet(31/78 Pages) NXP

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7.1.1 Input equivalent circuit

RSW1

CP2

VDD

Sampling

Source

Filter

Current Limiter

EXTERNAL CIRCUIT

INTERNAL CIRCUIT SCHEME

Source Impedance

Filter Resistance

Filter Capacitance

Current Limiter Resistance

RSW1 Channel Selection Switch Impedance

RAD Sampling Switch Impedance

Pin Capacitance (two contributions, CP1 and CP2)

Sampling Capacitance

CP1

RAD

Channel

Selection

Figure 8. Input equivalent circuit

Table 25. ADC conversion characteristics

Symbol

Parameter

Conditions1

Min

Typ

Max

Unit

fCK

ADC Clock frequency (depends on

ADC configuration) (The duty cycle

depends on AD_CK2 frequency.)

—

MHz

Sampling frequency

—

1.00

MHz

tsample

Sample time3

80 MHz@ 200 ohm source

impedance

275

—

tsampleC

SAR selftest C-algorithm sample time —

300

—

TsampleS

SAR selftest S-algorithm sample time —

—

µs

TsampleBG

Bandgap sample time

—

1.87

—

µs

TsampleTS

Temperature sensor sample time

—

3.18

—

µs

tconv

Conversion time4

80 MHz

650

—

CS, 5

ADC input sampling capacitance

—

CP15

ADC input pin capacitance 1

—

CP25

ADC input pin capacitance 2

—

0.8

RSW15

Internal resistance of analog source

VREF range = 3.0 to 3.6 V

—

875

RAD5

Internal resistance of analog source

—

825

INL

Integral non-linearity

—

–2

—

LSB

DNL

Differential non-linearity6

—

–1

—

LSB

OFS

Offset error

—

–4

—

LSB

GNE

Gain error

—

–4

—

LSB

Table continues on the next page...

Analog modules

S32R274/S32R264 Series Data Sheet, Rev. 6, 06/2021

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