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DSPIC33EP128GS708 Datasheet(PDF) 434 Page - Microchip Technology

Part # DSPIC33EP128GS708
Description  16-Bit Digital Signal Controllers for Digital Power Applications with Interconnected High-Speed PWM, ADC, PGA and Comparators
PDF  484 Pages
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Manufacturer  MICROCHIP [Microchip Technology]
Direct Link  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

DSPIC33EP128GS708 Datasheet(HTML) 434 Page - Microchip Technology

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dsPIC33EPXXXGS70X/80X FAMILY
DS70005258C-page 434
 2016-2018 Microchip Technology Inc.
TABLE 30-53: ANALOG-TO-DIGITAL CONVERSION TIMING REQUIREMENTS
AC CHARACTERISTICS
Standard Operating Conditions: 3.0V to 3.6V
(unless otherwise stated)(2)
Operating temperature
-40°C
 TA  +85°C for Industrial
-40°C
 TA  +125°C for Extended
Param
No.
Symbol Characteristics
Min. Typ.(1) Max.
Units
Conditions
Clock Parameters
AD50
TAD
ADC Clock Period
14.28
——
ns
Throughput Rate
AD51
FTP
SH0-SH3
—
—
3.25
Msps 70 MHz ADC clock, 12 bits, no pending
conversion at time of trigger
SH4
—
—
3.25
Msps
Note 1: These parameters are characterized but not tested in manufacturing.
2: The ADC module is functional at VBORMIN < VDD < VDDMIN, but with degraded performance. Unless
otherwise stated, module functionality is ensured, but not characterized.
TABLE 30-54: HIGH-SPEED ANALOG COMPARATOR MODULE SPECIFICATIONS
AC/DC CHARACTERISTICS
Standard Operating Conditions: 3.0V to 3.6V
(unless otherwise stated)(2)
Operating temperature
-40°C
 TA  +85°C for Industrial
-40°C
 TA  +125°C for Extended
Param
No.
Symbol
Characteristic
Min.
Typ.
Max.
Units
Comments
CM10
VIOFF
Input Offset Voltage
-35
±5
35
mV
CM11
VICM
Input Common-Mode
Voltage Range(1)
0—
AVDD
V
CM13
CMRR
Common-Mode
Rejection Ratio
60
—
—
dB
CM14
TRESP
Large Signal Response
—
15
—
ns
V+ input step of 100 mV while
V- input is held at AVDD/2. Delay
measured from analog input pin to
PWMx output pin.
CM15
VHYST
Input Hysteresis
5
10
20
mV
Depends on HYSSEL<1:0>
CM16
TON
Comparator Enabled to
Valid Output
——
1
µs
Note 1:
These parameters are for design guidance only and are not tested in manufacturing.
2:
The comparator module is functional at VBORMIN < VDD < VDDMIN, but with degraded performance. Unless
otherwise stated, module functionality is tested, but not characterized.



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