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S75WS256NDFBAWMB Datasheet(PDF) 98 Page - SPANSION

Part # S75WS256NDFBAWMB
Description  Stacked Multi-Chip Product (MCP)
PDF  216 Pages
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S75WS256NDFBAWMB Datasheet(HTML) 98 Page - SPANSION

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S75WS256Nxx Based MCPs
S75WS-N-00_00_A0 February 17, 2005
Data
Sheet
General Description
The S29RS512N is a 512 Mbit, 1.8 Volt-only, simultaneous Read/Write, Burst Mode Flash memory
device, organized as 33,554,432words of 16 bits each. This device uses a single VCC of 1.65 to
1.95 V to read, program, and erase the memory array. A 9.0-volt VHH on ACC may be used for
faster program performance in a factory setting environment.
The device uses Chip Enable (CE#), Write Enable (WE#), Address Valid (AVD#) and Output En-
able (OE#) to control asynchronous read and write operations. For burst operations, the device
additionally requires Ready (RDY), and Clock (CLK). This implementation allows easy interface
with minimal glue logic to a wide range of microprocessors/microcontrollers for high performance
read operations.
The burst read mode feature gives system designers flexibility in the interface to the device. The
user can preset the burst length and then wrap or non-wrap through the same memory space, or
read the currently addressable flash array block in continuous mode.
The rising clock edge initiates burst accesses and determines when data will be output.
The device is entirely command set compatible with the JEDEC 42.4 single-power-supply
Flash standard. Commands are written to the command register using standard microprocessor
write timing. Register contents serve as inputs to an internal state-machine that controls the
erase and programming circuitry. Write cycles also internally latch addresses and data needed for
the programming and erase operations. Reading data out of the device is similar to reading from
other Flash or EPROM devices.
Device programming occurs by executing the program command sequence. This initiates the Em-
bedded Program algorithm - an internal algorithm that automatically times the program pulse
widths and verifies proper cell margin. The Unlock Bypass mode facilitates faster program times
by requiring only two write cycles to program data instead of four. Additionally, Write Buffer Pro-
gramming is available on this family of devices. This feature provides superior programming
performance by grouping locations being programmed.
Device erasure occurs by executing the erase command sequence. This initiates the Embedded
Erase algorithm - an internal algorithm that automatically preprograms the array (if it is not al-
ready programmed) before executing the erase operation. During erase, the device automatically
times the erase pulse widths and verifies proper cell margin.
The Program Suspend/Program Resume feature enables the user to put program on hold to
read data from any sector that is not selected for programming. If a read is needed from the Dy-
namic Protection area after a program suspend, then the user must use the proper command
sequence to enter and exit this region. The program suspend/resume functionality is also avail-
able when programming in erase suspend (1 level depth only).
The Erase Suspend/Erase Resume feature enables the user to put erase on hold to read data
from, or program data to, any sector that is not selected for erasure. True background erase can
thus be achieved. If a read is needed from the Dynamic Protection area, after an erase suspend,
then the user must use the proper command sequence to enter and exit this region.
The hardware RESET# pin terminates any operation in progress and resets the internal state
machine to reading array data. The RESET# pin may be tied to the system reset circuitry. A sys-
tem reset would thus also reset the device, enabling the system microprocessor to read boot-up
firmware from the Flash memory device.
The host system can detect whether a memory array program or erase operation is complete by
using the device status bit DQ7 (Data# Polling), DQ6/DQ2 (toggle bits), DQ5 (exceeded timing
limit), DQ3 (sector erase start timeout state indicator), and DQ1 (write to buffer abort). After a
program or erase cycle has been completed, the device automatically returns to reading array
data.



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