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MSP430F435IPZ Datasheet(PDF) 68 Page - Texas Instruments

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Part # MSP430F435IPZ
Description  MIXED SIGNAL MICROCONTROLLER
PDF  85 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

MSP430F435IPZ Datasheet(HTML) 68 Page - Texas Instruments

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MSP430x43x, MSP430x44x
MIXED SIGNAL MICROCONTROLLER
SLAS344A – JANUARY 2002 – REVISED FEBRUARY 2002
68
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
JTAG, program memory and fuse
PARAMETER
TEST CONDITIONS
MIN
NOM
MAX
UNIT
f
JTAG/T
t
TCK freq enc
VCC = 2.2 V
DC
5
MH
f(TCK)
JTAG/Test
(see Note 4)
TCK frequency
VCC = 3 V
DC
10
MHz
(see Note 4)
Pull-up resistors on TMS, TCK, TDI (see Note 1)
VCC = 2.2 V/3 V
25
60
90
k
Ω
V(FB)
JTAG/f
Fuse-blow voltage, F versions (see Note 3)
VCC = 2.2 V/3 V
6
7
V
I
JTAG/fuse
(see Note 2)
Supply current on TDI with fuse blown
100
mA
I(FB)
(see Note 2)
Time to blow the fuse
1
ms
I(DD-PGM)
F-versions only
Current from DVCC when programming is active
VCC = 2.7 V/3.6 V
3
5
mA
I(DD-Erase)
F versions only
(see Note 4)
Current from DVCC when erase is active
VCC = 2.7 V/3.6 V
3
5
mA
t(t ti )
F versions only
Write/erase cycles
104
105
cycles
t(retention)
F-versions only
Data retention TJ = 25°C
100
years
NOTES:
1. TMS, TDI, and TCK pull-up resistors are implemented in all F versions.
2. Once the fuse is blown, no further access to the MSP430 JTAG/test feature is possible. The JTAG block is switched to bypass mode.
3. The supply voltage to blow the fuse is applied to the TDI pin.
4. f(TCK) may be restricted to meet the timing requirements of the module selected. Duration of the program/erase cycle is determined
by f(FTG) applied to the flash timing controller. It can be calculated as follows:
t(word write) = 33 x 1/f(FTG)
t(segment write, byte 0) = 30 x 1/f(FTG)
t(segment write end sequence) =5 x 1/f(FTG)
t(mass erase) = 5296 x 1/f(FTG)
t(segment erase) = 4817 x 1/f(FTG)



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