LPC2921 datasheet(65/81 Pages) PHILIPS

65 / 81 page

LPC2921_2923_2925_0

Preliminary data sheet

Rev. 00.01 — 24 October 2008

65 of 81

NXP Semiconductors

LPC2921/2923/2925

ARM9 microcontroller with CAN and LIN

9.3 Dynamic characteristics: I2C-bus interface

[1]

All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb =125 °C ambient

temperature on wafer level. Cased products are tested at Tamb =25 °C (final testing). Both pre-testing and final testing use correlated

test conditions to cover the specified temperature and power supply voltage range.

[2]

Typical ratings are not guaranteed. The values listed are at room temperature (25

°C), nominal supply voltages.

[3]

Bus capacitance Cb in pF, from 10 pF to 400 pF.

Table 34.

Dynamic characteristic: I2C-bus pins

VDD(CORE) =VDD(OSC_PLL); VDD(IO) = 2.7 V to 3.6 V; VDDA(ADC3V3) = 3.0 V to 3.6 V; all voltages are measured with respect to

ground; positive currents flow into the IC; unless otherwise specified[1]

Symbol

Parameter

Conditions

Min

Typ[2]

Max

Unit

tf(o)

output fall time

VIH to VIL

20 + 0.1

× C

[3]

rise time

<tbd>

fall time

<tbd>

tBUF

bus free time between a STOP and

START condition

<tbd>

tLOW

LOW period of the SCL clock

<tbd>

tHD;STA

hold time (repeated) START

condition

<tbd>

tHIGH

HIGH period of the SCL clock

<tbd>

tSU;DAT

data set-up time

<tbd>

tSU;STA

set-up time for a repeated START

condition

<tbd>

tSU;STO

set-up time for STOP condition

<tbd>

Fig 22. I2C-bus pins clock timing

002aad985

tHD;STA

tBUF

tHD;STA

tSU;STA

tSU;DAT

tHIGH

tSU;STO

tHD;STA

tLOW

SDA

SCL

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