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H5GQ2H24AFR-R0C Datasheet(PDF) 68 Page - Hynix Semiconductor |
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H5GQ2H24AFR-R0C Datasheet(HTML) 68 Page - Hynix Semiconductor |
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68 / 172 page ![]() This document is a general product description and is subject to change without notice. Hynix Semiconductor does not assume any responsability for use of circuits described. No patent licenses are implied. Rev. 1.2 /Nov. 2011 68 H5GQ2H24AFR Figure 38. Mode Register Set Timings 5.5. ACTIVATION Before any READ or WRITE commands can be issued to a bank in the GDDR5 SGRAM, a row in that bank must be “opened”. This is accomplished by the ACTIVE command (see Figure 39): BA0 ‐BA3 select the bank, and A0‐A12 select the row to be activated. Once a row is open, a READ or WRITE command could be issued to that row, subject to the tRCD specification. A subsequent ACTIVE command to another row in the same bank can only be issued after the previous row has been closed (precharged). The minimum time interval between two successive ACTIVE com‐ mands on the same bank is defined by tRC. A minimum time, tRAS, must have elapsed between opening and closing a row. A subsequent ACTIVE command to another bank can be issued while the first bank is being accessed, which results in a reduction of total row‐access overhead. The minimum time interval between two suc‐ cessive ACTIVE commands on different banks to different bank groups is defined by tRRDS. With bank groups enabled, the minimum time interval between two successive ACTIVE commands to different banks in the same bank group is defined by tRRDL. In all other cases the interval is defined by tRRDS. <Link>Figure shows the tRCD and tRRD definition. CK# CK CMD A.C. = any command allowed in bank idle state tRP tMRD Updating Setting New Setting Old Setting NOP PRE ALL NOP MRS NOP A.C. NOP |
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