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C6416 Datasheet(PDF) 78 Page - Texas Instruments

Part # C6416
Description  FIXD-POINT DIGITAL SIGNAL PROCESSORS
PDF  134 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

C6416 Datasheet(HTML) 78 Page - Texas Instruments

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SMJ320C6414, SMJ320C6415, SMJ320C6416
FIXEDPOINT DIGITAL SIGNAL PROCESSORS
SGUS050A − JANUARY 2004 − REVISED MARCH 2004
78
POST OFFICE BOX 1443
• HOUSTON, TEXAS 77251−1443
PARAMETER MEASUREMENT INFORMATION
Transmission Line
4.0 pF
1.85 pF
Z0 = 50
W
(see note)
Tester Pin Electronics
Data Sheet Timing Reference Point
Output
Under
Test
NOTE: The data sheet provides timing at the device pin. For output timing analysis, the tester pin electronics and its transmission line effects
must be taken into account. A transmission line with a delay of 2 ns or longer can be used to produce the desired transmission line effect.
The transmission line is intended as a load only. It is not necessary to add or subtract the transmission line delay (2 ns or longer) from
the data sheet timings.
42
W
3.5 nH
Device Pin
(see note)
Input requirements in this data sheet are tested with an input slew rate of < 4 Volts per nanosecond (4 V/ns) at the device pin.
Figure 12. Test Load Circuit for AC Timing Measurements
The tester load circuit is for characterization and measurement of AC timing signals. This load does not indicate
the maximum load the device is capable of driving.
signal transition levels
All input and output timing parameters are referenced to 1.5 V for both “0” and “1” logic levels.
Vref = 1.5 V
Figure 13. Input and Output Voltage Reference Levels for AC Timing Measurements
All rise and fall transition timing parameters are referenced to VIL MAX and VIH MIN for input clocks, VOL MAX
and VOH MIN for output clocks, VILP MAX and VIHP MIN for PCI input clocks, and VOLP MAX and VOHP MIN for
PCI output clocks.
Vref = VIL MAX (or VOL MAX or
Vref = VIH MIN (or VOH MIN or
VIHP MIN or VOHP MIN)
VILP MAX or VOLP MAX)
Figure 14. Rise and Fall Transition Time Voltage Reference Levels
signal transition rates
All timings are tested with an input edge rate of 4 Volts per nanosecond (4 V/ns).



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