STM32U375CE datasheet(136/222 Pages) STMICROELECTRONICS

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A device reset allows normal operations to be resumed.

The test results are given in the table below. They are based on the EMS levels and classes defined in application

note EMC design guide for STM8, STM32 and Legacy MCUs (AN1709).

Table 81. EMS characteristics

Symbol

Parameter

Conditions

Level/

Class

VFESD

Voltage limits to be applied on any I/O pin to

induce a functional disturbance

VDD = 3.3 V, TA = 25°C, fHCLK = 96 MHz, LQFP100_SMPS package

conforming to IEC 61000-4-2

VEFTB

Fast transient voltage burst limits to be

applied through 100 pF on VDD and VSS

pins to induce a functional disturbance

VDD = 3.3 V, TA = 25°C, fHCLK = 96 MHz, LQFP100_SMPS package

conforming to IEC 61000-4-4

Designing hardened software to avoid noise problems

The EMC characterization and optimization are performed at component level with a typical application

environment and simplified MCU software. Note that good EMC performance is highly dependent on the user

application and the software in particular.

Therefore it is recommended that the user applies EMC software optimization and prequalification tests in relation

with the EMC level requested for the application.

Software recommendations

The software flowchart must include the management of runaway conditions such as:

•

Corrupted program counter

•

Unexpected reset

•

Critical data corruption (control registers)

Prequalification trials

Most of the common failures (unexpected reset and program counter corruption) can be reproduced by manually

forcing a low state on the NRST pin or the oscillator pins for one second.

To complete these trials, ESD stress can be applied directly on the device, over the range of specification values.

When unexpected behavior is detected, the software can be hardened to prevent unrecoverable errors occurring.

See application note Software techniques for improving microcontrollers EMC performance (AN1015) for more

details.

Electromagnetic Interference (EMI)

The electromagnetic field emitted by the device is monitored while a simple application is executed (toggling two

LEDs through the I/O ports). This emission test is compliant with IEC 61967-2 standard that specifies the test

board and the pin loading.

Table 82. EMI characteristics for fHSE = 16 MHz and fHCLK = 96 MHz

Symbol

Parameter

Conditions

Monitored frequency band

Value

Unit

SEMI

Peak(1)

VDD = 3.6 V, TA = 25 ° C,

LQFP100_SMPS package compliant with IEC 61967-2

0.1 MHz to 30 MHz

dBμV

30 MHz to 130 MHz

130 MHz to 1 GHz

1 GHz to 2 GHz

Level(2)

0.1 MHz to 2 GHz

1. Refer to the EMI radiated test section of the application note EMC design guide for STM8, STM32 and Legacy MCUs (AN1709).

2. Refer to the EMI level classification section of the application note EMC design guide for STM8, STM32 and Legacy MCUs (AN1709).

5.3.12

Electrical sensitivity characteristics

Based on three different tests (ESD, latch-up) using specific measurement methods, the device is stressed in

order to determine its performance in terms of electrical sensitivity.

STM32U375xx

Electrical characteristics

DS14861 - Rev 2

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