STM32U375CE datasheet(138/222 Pages) STMICROELECTRONICS

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Functional susceptibility to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting current into the I/O pins

programmed in floating-input mode. While this current is injected into the I/O pin, one at a time, the device is

checked for functional failures.

The failure is indicated by an out-of-range parameter, such as an ADC error above a certain limit (higher than

5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out of the 5 µA/+0 µA range),

or other functional failure (for example reset occurrence or oscillator frequency deviation).

The characterization results are given in the table below. The negative induced leakage current is caused by the

negative injection. The positive induced leakage current is caused by the positive injection.

Table 85. I/O current injection susceptibility

The I/O structure options listed in this table can be a concatenation of options including the option explicitly listed. For instance, TT_a refers to

any TT I/O with _a option. TT_xx refers to any TT I/O and FT_xx refers to any FT I/O.

Evaluated by characterization. Not tested in production.

Symbol

Description

Functional susceptibility

Unit

Negative injection

Positive injection

IINJ

Injected current on PA3/PA4/PA5 and PB0 pins

Injected current on PB2/PB5 pins

N/A

Injected current on all other pins

N/A

5.3.14

I/O port characteristics

General input/output characteristics

Unless otherwise specified, the parameters given in Table 86 are derived from tests performed under the

conditions summarized in Table 27. All I/Os are designed as CMOS and TTL-compliant.

Note:

For information on GPIO configuration, refer to the application note STM32 GPIO configuration for hardware

settings and low

‑power consumption (AN4899).

STM32U375xx

Electrical characteristics

DS14861 - Rev 2

page 138/222

STM32U375CE Datasheet(PDF) 138 Page - STMicroelectronics