EP4CE40 datasheet(262/488 Pages) ALTERA

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10–6

Chapter 10: JTAG Boundary-Scan Testing for Cyclone IV Devices

Boundary-Scan Description Language Support

Cyclone IV Device Handbook,

December 2013

Altera Corporation

Volume 1

Figure 10–3 shows the JTAG chain of mixed voltages and how a level shifter is

inserted in the chain.

Boundary-Scan Description Language Support

The boundary-scan description language (BSDL), a subset of VHDL, provides a

syntax that allows you to describe the features of an IEEE Std. 1149.1/IEEE Std. 1149.6

BST-capable device that can be tested.

f For more information about how to download BSDL files for IEEE Std.

1149.1-compliant Cyclone IV E devices, refer to IEEE Std. 1149.1 BSDL Files.

f For more information about how to download BSDL files for IEEE Std.

1149.6-compliant Cyclone IV GX devices, refer to IEEE Std. 1149.6 BSDL Files.

f You can also generate BSDL files (pre-configuration and post-configuration) for

IEEE Std. 1149.1/IEEE Std. 1149.6-compliant Cyclone IV devices with the Quartus® II

software version 9.1 SP1 and later. For more information about the procedure to

generate BSDL files using the Quartus II software, refer to BSDL Files Generation in

Quartus II.

Figure 10–3. JTAG Chain of Mixed Voltages

Tester

Must be

3.3-V

tolerant

Must be

1.8-V

tolerant

Shift TDO to

level accepted by

tester if necessary

Must be

2.5-V

tolerant

3.3-V

VCCIO

2.5-V

VCCIO

1.5-V

VCCIO

1.8-V

VCCIO

Level

Shifter

TDI

TDO

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