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EP4CE40 Datasheet(PDF) 210 Page - Altera Corporation

Part # EP4CE40
Description  Cyclone IV Device Handbook, Volume 1
PDF  488 Pages
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Manufacturer  ALTERA [Altera Corporation]
Direct Link  http://www.altera.com
Logo ALTERA - Altera Corporation

EP4CE40 Datasheet(HTML) 210 Page - Altera Corporation

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8–46
Chapter 8: Configuration and Remote System Upgrades in Cyclone IV Devices
Configuration
Cyclone IV Device Handbook,
May 2013
Altera Corporation
Volume 1
f For more information about the JTAG boundary-scan testing, refer to the JTAG
Boundary-Scan Testing for Cyclone IV Devices chapter.
JTAG instructions have precedence over any other configuration modes. Therefore,
JTAG configuration can take place without waiting for other configuration modes to
complete. For example, if you attempt JTAG configuration in Cyclone IV devices
during PS configuration, PS configuration terminates and JTAG configuration begins.
If the MSEL pins are set to AS mode, the Cyclone IV device does not output a DCLK
signal when JTAG configuration takes place.
The four required pins for a device operating in JTAG mode are TDI, TDO, TMS, and TCK.
All the JTAG input pins are powered by the VCCIO pin and support the LVTTL I/O
standard only. All user I/O pins are tri-stated during JTAG configuration. Table 8–14
explains the function of each JTAG pin.
You can download data to the device through the USB-Blaster, MasterBlaster,
ByteBlaster II, or ByteBlasterMV download cable, or the EthernetBlaster
communications cable during JTAG configuration. Configuring devices with a cable is
similar to programming devices in-system. Figure 8–23 and Figure 8–24 show the
JTAG configuration of a single Cyclone IV device.
Table 8–14. Dedicated JTAG Pins
Pin Name
Pin Type
Description
TDI
Test data
input
Serial input pin for instructions as well as test and programming data. Data shifts in on the
rising edge of TCK. If the JTAG interface is not required on the board, the JTAG circuitry is
disabled by connecting this pin to VCC. TDI pin has weak internal pull-up resistors (typically 25
k
Ω).
TDO
Test data
output
Serial data output pin for instructions as well as test and programming data. Data shifts out on
the falling edge of TCK. The pin is tri-stated if data is not being shifted out of the device. If the
JTAG interface is not required on the board, the JTAG circuitry is disabled by leaving this pin
unconnected.
TMS
Test mode
select
Input pin that provides the control signal to determine the transitions of the TAP controller
state machine. Transitions in the state machine occur on the rising edge of TCK. Therefore,
TMS
must be set up before the rising edge of TCK. TMS is evaluated on the rising edge of TCK.
If the JTAG interface is not required on the board, the JTAG circuitry is disabled by connecting
this pin to VCC. TMS pin has weak internal pull-up resistors (typically 25 k
Ω).
TCK
Test clock
input
The clock input to the BST circuitry. Some operations occur at the rising edge, while others
occur at the falling edge. If the JTAG interface is not required on the board, the JTAG circuitry
is disabled by connecting this pin to GND. The TCK pin has an internal weak pull-down resistor.



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