| Electronic Components Datasheet Search |
|
EP4CE40 Datasheet(PDF) 210 Page - Altera Corporation |
|
|
|||||||||||||||||||||||||||||
EP4CE40 Datasheet(HTML) 210 Page - Altera Corporation |
|
210 / 488 page ![]() 8–46 Chapter 8: Configuration and Remote System Upgrades in Cyclone IV Devices Configuration Cyclone IV Device Handbook, May 2013 Altera Corporation Volume 1 f For more information about the JTAG boundary-scan testing, refer to the JTAG Boundary-Scan Testing for Cyclone IV Devices chapter. JTAG instructions have precedence over any other configuration modes. Therefore, JTAG configuration can take place without waiting for other configuration modes to complete. For example, if you attempt JTAG configuration in Cyclone IV devices during PS configuration, PS configuration terminates and JTAG configuration begins. If the MSEL pins are set to AS mode, the Cyclone IV device does not output a DCLK signal when JTAG configuration takes place. The four required pins for a device operating in JTAG mode are TDI, TDO, TMS, and TCK. All the JTAG input pins are powered by the VCCIO pin and support the LVTTL I/O standard only. All user I/O pins are tri-stated during JTAG configuration. Table 8–14 explains the function of each JTAG pin. You can download data to the device through the USB-Blaster, MasterBlaster, ByteBlaster II, or ByteBlasterMV download cable, or the EthernetBlaster communications cable during JTAG configuration. Configuring devices with a cable is similar to programming devices in-system. Figure 8–23 and Figure 8–24 show the JTAG configuration of a single Cyclone IV device. Table 8–14. Dedicated JTAG Pins Pin Name Pin Type Description TDI Test data input Serial input pin for instructions as well as test and programming data. Data shifts in on the rising edge of TCK. If the JTAG interface is not required on the board, the JTAG circuitry is disabled by connecting this pin to VCC. TDI pin has weak internal pull-up resistors (typically 25 k Ω). TDO Test data output Serial data output pin for instructions as well as test and programming data. Data shifts out on the falling edge of TCK. The pin is tri-stated if data is not being shifted out of the device. If the JTAG interface is not required on the board, the JTAG circuitry is disabled by leaving this pin unconnected. TMS Test mode select Input pin that provides the control signal to determine the transitions of the TAP controller state machine. Transitions in the state machine occur on the rising edge of TCK. Therefore, TMS must be set up before the rising edge of TCK. TMS is evaluated on the rising edge of TCK. If the JTAG interface is not required on the board, the JTAG circuitry is disabled by connecting this pin to VCC. TMS pin has weak internal pull-up resistors (typically 25 k Ω). TCK Test clock input The clock input to the BST circuitry. Some operations occur at the rising edge, while others occur at the falling edge. If the JTAG interface is not required on the board, the JTAG circuitry is disabled by connecting this pin to GND. The TCK pin has an internal weak pull-down resistor. |
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |