MM32F103CET datasheet(58/89 Pages) MINDMOTION

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DS_MM32F103xx_o_Ver1.13

Electrical characteristics

compliant with the IEC 1000-4-4 standard.

A device reset allows normal operations to be resumed.

The test results are given in the following table. They are based on the EMS levels and

classes defined in application note.

Table 28. EMS characteristics

Symbol

Parameter

Conditions

Level/Class

VEFT

Fast transientvoltage burst

limits to be applied through

100 pF on VDD and VSS

pinsto induce a functional

disturbance

VDD = 3.3V,TA=+25◦C,

fHCLK=48MHz.Conformingto

IEC 1000-4-4

TBD

Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical

application environment and simplified MCU software. It should be noted that good EMC

performance is highly dependent on the user application and the software in particular.

Therefore it is recommended that the user applies EMC software optimization and pre-

qualification tests in relation with the EMC level requested for his application.

Software recommendations

The software flowchart must include the management of runaway conditions such as:

• Corrupted program counter

• Unexpected reset

• Critical Data corruption (for example control registers)

Prequalification trials

Most of the common failures (unexpected reset and program counter corruption) can be

reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1

second.

To complete these trials, ESD stress can be applied directly on the device, over the range

of specification values. When unexpected behavior is detected, the software can be hard-

ened to prevent unrecoverable errors.

5.3.11 Absolute Maximum (Electrical Sensitivity)

Based on three different tests (ESD, LU) using specific measurement methods, the device

is stressed in order to determine its performance in terms of electrical sensitivity.

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