STM32WBA50KG datasheet(84/110 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32WBA50KG

84/110

DS14688 Rev 1

Static latch-up

The following complementary static tests are required on three parts to assess the latch-up

performance:

•

a supply overvoltage is applied to each power supply pin

•

a current injection is applied to each input, output and configurable I/O pin.

These tests are compliant with EIA/JESD 78A IC latch-up standard.

5.3.15

I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or

above VDD (for standard, 3.3 V-capable I/O pins) should be avoided during normal product

operation. However, in order to give an indication of the robustness of the microcontroller if

abnormal injection accidentally happens, some susceptibility tests are performed on a

sample basis during device characterization.

Functional susceptibility to I/O current injection

While a simple application is executed, the device is stressed by injecting current into the

I/O pins programmed in floating input mode. While current is injected into the I/O pin, one at

a time, the device is checked for functional failures.

The failure is indicated by an out-of-range parameter, such as an ADC error above a certain

limit (higher than 5 LSB ET), out of conventional limits of induced leakage current on

adjacent pins (out of the -5 µA / 0 µA range) or other functional failure (for example reset

occurrence or oscillator frequency deviation).

The characterization results are given in Table 60. The negative/positive induced leakage

current is caused by the negative/positive injection.

5.3.16

I/O port characteristics

General input/output characteristics

The parameters given in Table 61 are derived from tests performed at ambient temperature

and under the supply voltage conditions summarized in Table 26. All I/Os are designed as

CMOS- and TTL-compliant.

Table 59. Electrical sensitivity(1)

1. Evaluated by characterization, not tested in production, unless otherwise specified.

Symbol

Parameter

Conditions

Class

Static latch-up class

TJ = 130 °C conforming to JESD78E

Table 60. I/O current injection susceptibility(1)

1. Evaluated by characterization, not tested in production, unless otherwise specified.

Symbol

Description

Functional susceptibility

Unit

Negative injection

Positive injection

IINJ

Injected current on all pins

N/A

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